2013
DOI: 10.1364/ol.38.004698
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Photocurrent limit in nanowires

Abstract: Square root photocurrent dependences of nanowires on light intensity were reported in the literature without clarification of the limiting effect. In this Letter, we derived a relation excellently fitting the observed nonlinearities and, intensifying the significance of the result, we demonstrated that the fit parameters involved can be employed to determine the impurity concentration and electronic response time of nano-sized semiconductors.

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Cited by 13 publications
(12 citation statements)
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“…Very recently, for NW devices based on ZnO and PbS, Ullrich reported on a change of the power-law exponent from close to unity for smaller illumination intensities to 0.5 for very high illumination powers . Interestingly, the power-law exponent of 0.8 for our QNWs devices did not change over the whole range of illumination intensities.…”
Section: Results and Discussionsupporting
confidence: 45%
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“…Very recently, for NW devices based on ZnO and PbS, Ullrich reported on a change of the power-law exponent from close to unity for smaller illumination intensities to 0.5 for very high illumination powers . Interestingly, the power-law exponent of 0.8 for our QNWs devices did not change over the whole range of illumination intensities.…”
Section: Results and Discussionsupporting
confidence: 45%
“…40 Very recently, for NW devices based on ZnO and PbS, Ullrich reported on a change of the power-law exponent from close to unity for smaller illumination intensities to 0.5 for very high illumination powers. 42 Interestingly, the power-law exponent of 0.8 for our QNWs devices did not change over the whole range of illumination intensities. However, we cannot exclude any change in the exponent for even larger illumination intensities than the maximum of 240 mW/cm 2 as used in our experiments.…”
Section: ■ Results and Discussionmentioning
confidence: 71%
“…It was fitted by a power law (Δ j = 1.6 × 10 –2 ϕ 0 0.63 ). The generation rate of photoelectrons by incident light ( G pe ) is given by the expression , where B c is the recombination coefficient, n pe is the density of photoelectrons, and M is number of impurity levels per cm 3 . For BiVO 3 F n pe ≫ M and eq follows a power law: This suggests the dominant photocarrier decay mechanism is from e–h recombination rather than a trap-dominated recombination process.…”
Section: Resultsmentioning
confidence: 99%
“…It was fitted by a power law (j=1.6x10 -2 f0 0.63 ). The generation rate of photoelectrons by incident light (Gpe) is given by the expression 45,46 :…”
Section: Figure 5 A) Total and Atomic Resolved Projected Dos For Bivo3f (U=3 Ev Fm/afm Spin Polarized Configuration)b) Diffuse-reflectancmentioning
confidence: 99%
“…This behavior can be assigned to the presence of structural defects acting as photoelectron traps within the structure. 20 Finally, the stable photocurrent upon successive measurements (Fig. S7, ESI †) indicates very good stability of these samples.…”
mentioning
confidence: 80%