2020
DOI: 10.1007/s10854-020-03549-7
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Photocurrent transient measurements in MAPbI3 thin films

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Cited by 46 publications
(26 citation statements)
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“…A shorter τ r is attributable to the higher photosensitivity. The decay time (t decay ) is taken from the I max to I stable , which depends on the recombination rate of the photo-induced electrons and holes [59]. The average t decay of the undoped, and In-, Sn-, and (In, Sn)-doped Bi 2 Se 3 nanoplatelets are estimated as 0.091, 0.097, 0.099, and 0.105 sec.…”
Section: Raman Spectramentioning
confidence: 99%
“…A shorter τ r is attributable to the higher photosensitivity. The decay time (t decay ) is taken from the I max to I stable , which depends on the recombination rate of the photo-induced electrons and holes [59]. The average t decay of the undoped, and In-, Sn-, and (In, Sn)-doped Bi 2 Se 3 nanoplatelets are estimated as 0.091, 0.097, 0.099, and 0.105 sec.…”
Section: Raman Spectramentioning
confidence: 99%
“…3b. The power law index of 0.785 implies the predominant bimolecular (electron-hole) recombination [72]. Fig.…”
Section: Resultsmentioning
confidence: 98%
“…The presence of structural defects in meshed MoS 2 samples and the adsorbed impurities by the mesh-like surface take the responsibility for reduced carrier mobilities and conductance relaxation as charge trapping sites [71]. Especially, thermally generated traps can lead to photocurrent decay during illumination [72]. The photo-induced mechanism of decreasing positive photoconductivity with the increasing illumination time is proposed in Fig.…”
Section: Resultsmentioning
confidence: 99%
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