Photoelastic-modulator-based differential frequency polarization modulation measurement and error analysis

Zhibin, 王志斌 Wang; Rui, 张瑞 Zhang; Dong-e, 赵冬娥 Zhao; Youhua, 陈友华 Chen; Hai-chao, 魏海潮 Wei

doi:10.3788/ope.20132104.0876

Cited by 1 publication

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“…The photoelastic modulator (PEM) is a resonant polarization modulator operating on the basis of the photoelastic effect [1], which has the advantages of no mechanical vibration, a wide range of applicable wave bands (from the UV to the IR), and a high modulation frequency (tens to hundreds of kHz) [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. The PEM-based Fourier transform spectrometer (PEM-FTS) is capable of providing greater than 10 5 interferograms/ spectra scanned per second [10], as opposed to a few thousand scans per second available spectral resolutions useful in the infrared is difficult.…”

Section: Introductionmentioning

confidence: 99%

A high retardation-amplitude photoelastic modulator study for an ultra-high speed infrared spectroscopy remote sensing measurement system

Zhang

Wen

et al. 2016

Meas. Sci. Technol.

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The currently allowable photoelastic modulator based Fourier transform spectrometer (PEM-FTS) retardation-amplitude is low, and spectral resolution is relatively poor. This paper presents a method for high retardation-amplitude whose PEM is based on microtrapezoidal photoelastic crystals and Herriott-PEM. The retardation-amplitude of the improved PEM is about 19 times larger than an ordinary PEM. The ultra-high speed infrared spectroscopy remote measurement prototype is designed based on high retardation-amplitude PEM. The best spectral resolution of the prototype is 4 cm −1 , and the zero-crossing single sided interferogram scanning time is less than 5 µs.

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