The work presents the results of research on the systems formed from thin films of copper phthalocyanine (CuPc), N-N′-dimethylperylene-3,4,9,10-dicarboximide (MePTCDI), electrodes of ITO and Ag, and from buffer layers: MoO3 at ITO and BCP at Ag. We have observed the effect of each buffer layer on voltage dependence of dark current and photocurrent, and on open circuit voltage-light intensity relationship. The system with both buffer layers exhibited the highest values of open circuit voltage and fill factor. The buffer layers improve transport of charge carriers within near-electrode regions, reduce dissociation of excitons on electrodes and reveal processes of charge carrier generation and recombination within the CuPc/MePTCDI junction.