2014
DOI: 10.1016/j.solmat.2014.01.045
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Photoelectrical characterization of a new generation diode having GaFeO3 interlayer

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Cited by 55 publications
(13 citation statements)
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“…It is seen that photovoltage is only proportional to the incident light power [6,14]. Similar results were reported by Soylu et al [16]. They fabricated p-Si heterojunction based on graphene oxide, and investigated the influence of light intensity on the photodiode parameters.…”
Section: Resultssupporting
confidence: 82%
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“…It is seen that photovoltage is only proportional to the incident light power [6,14]. Similar results were reported by Soylu et al [16]. They fabricated p-Si heterojunction based on graphene oxide, and investigated the influence of light intensity on the photodiode parameters.…”
Section: Resultssupporting
confidence: 82%
“…As seen from the Table 2, the values of responsivity for the studied heterojunction based on BTB are higher than that of device reported in the ref. [16]. According to the results of the heterojunction, it can be possible to use the innovative fabrication process for the improvement of the photovoltaic parameters in solar cells, and dye sensitized solar cell devices.…”
Section: Resultsmentioning
confidence: 99%
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“…5b, with a magnitude of *0.83 which indicates a not complete exponentially dependence for the photocurrent and the power of the incident light and then the probability for the presence of trap centers through the band gap. Accordingly, the generation process for the photocurrent in the studied diode can strongly be affected by the located traps and the life times of the photogenerated carriers can be determined by the number of the located traps [33]. Phototransient current characteristics of Cu 2 O/p-Si diodes under different light intensities are shown in Fig.…”
Section: Current-voltage Characterization Of the Cu 2 O/ P-si Diodementioning
confidence: 99%
“…The light illumination dependence of barrier height can be expressed by the following relation [33]:…”
Section: Current-voltage Characterization Of the Cu 2 O/ P-si Diodementioning
confidence: 99%