2001
DOI: 10.1016/s0254-0584(01)00319-4
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Photoelectrochemical investigation of Ag2S thin films deposited by SILAR method

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Cited by 44 publications
(21 citation statements)
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“…The XRD patterns of Ag 2 S&CdS-TNAs and CdS&Ag 2 S-TNAs are shown in Fig. 3a [33][34][35]. The weak diffraction peaks of Ag 2 S and CdS phases manifest that these particles render small sizes, in accordance with the a-few-nm range determined with TEM.…”
Section: Characterizationssupporting
confidence: 69%
“…The XRD patterns of Ag 2 S&CdS-TNAs and CdS&Ag 2 S-TNAs are shown in Fig. 3a [33][34][35]. The weak diffraction peaks of Ag 2 S and CdS phases manifest that these particles render small sizes, in accordance with the a-few-nm range determined with TEM.…”
Section: Characterizationssupporting
confidence: 69%
“…These results reveal that PEC performance of BiVO 4 can be well artificially regulated through p‐n hetero‐configuration. Silver sulfide (Ag 2 S), as a typical p‐type semiconductor, takes a narrow band gap (1.0 eV), which also greatly facilitates its solar harvesting ability ,. To integrate Ag 2 S with other semiconductors has realize efficient photodegradation of dyes and photocatalytic hydrogen production.…”
Section: Introductionmentioning
confidence: 99%
“…Today there is a great amount of data devoted to the production process of films and silver sulfide residues by both high temperature methods: thermal evaporation [2, 4,11,12], electro-deposition [5,13], molecular beam epitaxy (MBE) [14], gamma-irradiation [15], chemical deposition from vapour phase [16], sulfurization [17,18], and low temperature methods: SILAR method [19,20], chemical deposition [1,[21][22][23].…”
Section: Introductionmentioning
confidence: 99%