1995
DOI: 10.1016/0039-6028(95)00700-8
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Photoelectron diffraction study of ultrathin film growth of Ni on Pt(111)

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Cited by 21 publications
(8 citation statements)
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“…Ultrathin metallic films epitaxially grown on metallic substrates have been the subjects of many studies because they present very unusual chemical, electronic and magnetic properties, which differ from the corresponding bulk counterparts [276][277][278][279][280][281]. The structure of the grown films is affected by the corresponding substrate with certain crystalline facets [278].…”
Section: The Critical Layer Number Of Epitaxially Grown Filmsmentioning
confidence: 99%
See 1 more Smart Citation
“…Ultrathin metallic films epitaxially grown on metallic substrates have been the subjects of many studies because they present very unusual chemical, electronic and magnetic properties, which differ from the corresponding bulk counterparts [276][277][278][279][280][281]. The structure of the grown films is affected by the corresponding substrate with certain crystalline facets [278].…”
Section: The Critical Layer Number Of Epitaxially Grown Filmsmentioning
confidence: 99%
“…[33] [278][279][280][281] nearest atoms at neighbor planes and that of the film surface, the total value of elastic energy of the film G e will be larger than the total non-coherent interface free energy G i = Aγ i . Subsequently, the stable strain-free structure with a non-coherent interface is recovered at a critical layer number m c where a transition from the strained structure to a normal one occurs.…”
Section: The Critical Layer Number Of Epitaxially Grown Filmsmentioning
confidence: 99%
“…It is interesting that the growth mode of Ni/1 ML Co/ Pt͑111͒ is identical to Ni/ Pt͑111͒ where the growth mode is a layer-by-layer mode, at least for first two monolayers. 11 We found that the magnetic properties of Ni/ Pt͑111͒ have dramatic changes after 1 ML of Co buffer layer was inserted. The MOKE signals of Ni on Pt(111) measured at room temperature are shown in Fig.…”
Section: Resultsmentioning
confidence: 77%
“…5,6 In the present work, in order to determine the point corresponding to the completion of the first monolayer of Ni deposited on Pt(111), we used a combination of XPS and LEIS. 13 The point at which the Pt signal disappears in the LEIS spectrum was assumed to correspond to the deposition of the first monolayer of Ni.…”
Section: Resultsmentioning
confidence: 99%