Photoelectron Energy Loss in Al(002) Revisited: Retrieval of the Single Plasmon Loss Energy Distribution by a Fourier Transform Method

Santana, Victor M.; David, D.; Almeida, J. S. de; Godet, C.

doi:10.1007/s13538-018-0566-8

Cited by 9 publications

(6 citation statements)

References 55 publications

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“…No arbitrary background removal is performed in the PEELS distribution since all energy losses are assigned to plasmon excitations along with some inter band transitions, in line with previous assumptions [47,57,60,61]. In this work, intrinsic plasmon excitations are overlooked [47] and the ELF is supposed to be independent of the photoelectron creation depth.…”

Section: Fourier Transform Analysis Of Peels Datamentioning

confidence: 72%

“…In order to eliminate multiple-order losses, the FT algorithm requires accurate determination of zero-loss peak (ZLP) line shape, energy distribution of the X-ray photon source and electron analyzer resolution [47]. The ZLP is modeled as a convolution between Gaussian experimental broadening (FWHM = 0.31 eV, = 0.187 eV) and Lorentzian natural line shape of the P 1s core level in BPh (FWHM = = 0.426 eV).…”

Section: Fourier Transform Analysis Of Peels Datamentioning

confidence: 99%

“…Well-defined equidistant energy-loss peaks correspond to successive plasmon excitations. Their spectral distribution being described by multiple convolution products of the ELF distribution corresponding to a single excitation, the Fourier Transform (FT) method described previously [47] is well suited to analyze PEELS data in order to retrieve the energy loss function. This classical dielectric model assumes identical ELF distributions for intrinsic plasmon production (sudden creation of a core hole) and extrinsic plasmon excitation along the electron path across the solid to the surface.…”

Section: Introductionmentioning

confidence: 99%

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Quantitative analysis of plasmon excitations in hard x-ray photoelectron spectra of bulk black phosphorus

David

Godet

Johansson

et al. 2020

Applied Surface Science

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Section: Fourier Transform Analysis Of Peels Datamentioning

confidence: 72%

Section: Fourier Transform Analysis Of Peels Datamentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Quantitative analysis of plasmon excitations in hard x-ray photoelectron spectra of bulk black phosphorus

David

Godet

Johansson

et al. 2020

Applied Surface Science

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“…The zero-loss Al 2p peak ( Figure 5) can be well fitted with asymmetric line shape, e.g. with a Doniach-Sunjic shape [38,39]…”

Section: Surface Chemistry and Binding Energiesmentioning

confidence: 83%

Depth profiling of noble gas atoms implanted in Al matrix: A photoelectron energy loss spectroscopy study

2018

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Highlights • Non-destructive XPS method provides depth and width of implanted atom profiles • Measurement of plasmon peak intensities vs photoelectron emission angle • Analytical model for Gaussian, triangular and rectangular depth distributions • Model assumes that energy losses are dominated by extrinsic plasmon excitation • Application to the Ar↓Al system and comparison with Monte Carlo simulations

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“…The PEELS technique was applied to the sample of ZnO NRs from its XPS spectratoevaluate the electronic properties by retrieving the experimental dielectric function [14,15]. This technique has the advantage to extendenergy range of analysis towards higher energies, where we cannot have access by optical techniques.…”

Section: Introductionmentioning

confidence: 99%

Optical properties from photoelectron energy-loss spectroscopy of low-temperature aqueous chemically synthesized ZnO nanorods grown on Si

David

Alnoor

Santana

et al. 2019

Semicond. Sci. Technol.

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The optical properties of zinc oxide (ZnO) nanorods (NRs) synthesized by the low-temperature aqueous chemical method on top of silicon (Si) substrate have been investigated by means of photoelectron energy loss spectroscopy (PEELS). The ZnO NRs were obtained by the low temperature aqueous chemical synthesis on top of Si substrate. The measured valence band, the dynamical dielectric functions and optical absorption of the material show a reasonable agreement when the trending and shape of the theoretical calculations are considered. A first-principle calculation based on density functional theory (DFT) was performed using the partially self-consistent GW approximation (scGW 0 ) and compared to the experimental results. The application of these two techniques brings a new analysis of the electronic properties of this material. The experimental results regarding the density of states (DOS) obtained for the valence band using x-ray photoelectron spectroscopy (XPS) was found to be consistent with the theoretical calculated value. Due to this consistency, the same wavefunctions was then employed to calculate the dielectric function of the ZnO NRs. The experimentally extracted dielectric function was also consistent with the calculated values.

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Photoelectron Energy Loss in Al(002) Revisited: Retrieval of the Single Plasmon Loss Energy Distribution by a Fourier Transform Method

Cited by 9 publications

References 55 publications

Quantitative analysis of plasmon excitations in hard x-ray photoelectron spectra of bulk black phosphorus

Quantitative analysis of plasmon excitations in hard x-ray photoelectron spectra of bulk black phosphorus

Depth profiling of noble gas atoms implanted in Al matrix: A photoelectron energy loss spectroscopy study

Optical properties from photoelectron energy-loss spectroscopy of low-temperature aqueous chemically synthesized ZnO nanorods grown on Si

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