2012
DOI: 10.1380/ejssnt.2012.565
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Photoelectron Mean Free Path on the EXAFS Analyses for Nanoparticles

Abstract: We calculate the inelastic mean free path (IMFP) for small metal particles based on the plasmon model for free electron gas confined in small sphere with radius a. The IMFP decreases with the radius a smaller than about 100Å, and the rate of the decrease depends on the bulk plasmon energy ωp. We furthermore discuss the coordination numbers obtained from the EXAFS curve fitting method for small Ag particles. We find the importance of the size dependent IMFP for EXAFS analyses in order to obtain reliable coordin… Show more

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Cited by 5 publications
(3 citation statements)
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“…While for n S , the trend of the experimental results agrees well with that of the calculated results, and the experimental values of n B are slightly smaller than the calculated values. In general, the coordination number appears smaller than it is . This trend is true in our results, as shown in Figure a.…”
Section: Resultssupporting
confidence: 79%
See 1 more Smart Citation
“…While for n S , the trend of the experimental results agrees well with that of the calculated results, and the experimental values of n B are slightly smaller than the calculated values. In general, the coordination number appears smaller than it is . This trend is true in our results, as shown in Figure a.…”
Section: Resultssupporting
confidence: 79%
“…In general, the coordination number appears smaller than it is. 61 This trend is true in our results, as shown in Figure 3a. Moreover, the difference may be caused by the assumption of only two bonding length types, where the type of bonding between a surface atom and an inside atom is included in n B in the calculation.…”
Section: Saxs Analysismentioning
confidence: 99%
“…Plasmon produced by collective electron excitation influenced by electrical state of materials is studied in order to evaluate its mean free path and escape depth [1,2]. Core-level X-ray photoemission spectra (XPS) have clear plasmon loss bands in low energy side in addition to the main sharp band for simple metals and semiconductors.…”
Section: Introductionmentioning
confidence: 99%