Handbook of Spectroscopy 2014
DOI: 10.1002/9783527654703.ch45
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Photoelectron Spectroscopy Applications to Materials Science

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Cited by 4 publications
(6 citation statements)
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“…When the assembly thickness is high enough, this specific interaction is smeared by the overall contributions and the XPS line shape comes back to the initial "pointed" shape. Note that there is no change in the stoichiometry dependence of the XPS signal for the various films: They all fulfill the "intact molecule" requirement, 32,42 Solid state effects on the XPS line shape and shake up intensities are reported in the literature when comparing solid state and gas phase spectra of several small molecules; 26,43−45 however, this information was not yet correlated to morphological investigation.…”
Section: ■ Results and Discussionmentioning
confidence: 83%
“…When the assembly thickness is high enough, this specific interaction is smeared by the overall contributions and the XPS line shape comes back to the initial "pointed" shape. Note that there is no change in the stoichiometry dependence of the XPS signal for the various films: They all fulfill the "intact molecule" requirement, 32,42 Solid state effects on the XPS line shape and shake up intensities are reported in the literature when comparing solid state and gas phase spectra of several small molecules; 26,43−45 however, this information was not yet correlated to morphological investigation.…”
Section: ■ Results and Discussionmentioning
confidence: 83%
“…XPS is an effective and powerful tool for investigation of organic and organic radical thin films . Besides providing insight into the occupied states, it is element-sensitive, and it can also deliver quantitative information on the stoichiometric composition of the films, due to the high sensitivity of the signal to the concentration of the emitting atoms. In addition, the features contributing to the spectroscopic lines are sensitive to the different chemical environment of the atoms of the same element.…”
Section: Results and Discussionmentioning
confidence: 99%
“…7 The method is element-sensitive, and allows insight into the stoichiometry of the film, and is sensitive towards the different chemical environments of atoms of the same element. 20 We focus on the C 1s and N 1s core level spectra (for NN-Blatter in Figure 1) because the O 1s core level spectrum is the sum of the substrate (SiO2/Si(111) wafers) and molecule signals, making the analysis unreliable. What is important is that the unpaired electrons are in the moieties containing nitrogen atoms.…”
Section: Resultsmentioning
confidence: 99%
“…We used X-ray photoelectron spectroscopy (XPS) to investigate the thin films because it is proven to be an efficient tool for the investigation of organic radical thin films . The method is element-sensitive and allows insights into the stoichiometry of the film, and it is sensitive toward the different chemical environments of atoms of the same element …”
Section: Resultsmentioning
confidence: 99%