2015
DOI: 10.1051/epjap/2015150075
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Photoelectron spectroscopy of transition metal oxide interfaces

Abstract: Abstract. In the present paper we review applications of the photoelectron spectroscopy (PES) technique to the investigation of transition metal oxide (TMO) interfaces. We summarize very briefly some of the principle, specific characteristics of TMOs. Because of the buried nature of the interfaces, the photoelectrons must penetrate certain thicknesses of material, which is easier with higher kinetic energies in the keV range. Thus, we also briefly summarize some of the hallmarks of hard X-ray photoelectron spe… Show more

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Cited by 9 publications
(5 citation statements)
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“…Possible developments of the present angle-resolved method include the use of HAXPES , to be more bulk sensitive and gain further information on stoichiometry at the interface by contrasting and comparing the soft X-ray with hard X-ray results.…”
Section: Results and Discussionmentioning
confidence: 99%
“…Possible developments of the present angle-resolved method include the use of HAXPES , to be more bulk sensitive and gain further information on stoichiometry at the interface by contrasting and comparing the soft X-ray with hard X-ray results.…”
Section: Results and Discussionmentioning
confidence: 99%
“…x-ray diffraction and scattering; [127][128][129] of the electronic state and band alignment via x-ray photoemission spectroscopy (XPS); [130][131][132][133][134] and of the electronic band structure using x-ray absorption spectroscopy (XAS). [135][136][137][138][139][140][141] With the advent of free electron laser sources, 142 capable of producing extremely intense, highly transverse coherent, and ultra-short (few fs long) pulsed x-ray beams, it is now possible to investigate ultrafast dynamical processes in ferroelectric systems, including phonon dynamics and ultrafast switching induced by strong THz light beams.…”
Section: Epitaxial Ferroelectric Interfacial Devicesmentioning
confidence: 99%
“…We employ hard X-ray photoelectron spectroscopy (HAXPES) as a powerful nondestructive and element-sensitive probing technique. 19,20 HAXPES enables the chemical depth profiling of the functional oxide layer and the buried heterointerfaces, as schematically depicted in Fig. 1.…”
Section: Introductionmentioning
confidence: 99%