1999
DOI: 10.1016/s0169-4332(98)00753-3
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Photoelectron studies of electrochemical diffusion of conducting polymer/transparent conductive metal oxide film interfaces

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Cited by 13 publications
(5 citation statements)
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“…In the pure PTh sample, about 45% fraction of thiophene contain the oxidized sulfur. The third peak (at 167.57 eV) is associated with the formation of positively charged sulfur (S δ+ ) [28]. This positive charge is consistent with the formation and transport of polarons and bipolarons in the conductive grafted polythiophene chains.…”
Section: Xrd and Xps Characterizationsupporting
confidence: 57%
See 1 more Smart Citation
“…In the pure PTh sample, about 45% fraction of thiophene contain the oxidized sulfur. The third peak (at 167.57 eV) is associated with the formation of positively charged sulfur (S δ+ ) [28]. This positive charge is consistent with the formation and transport of polarons and bipolarons in the conductive grafted polythiophene chains.…”
Section: Xrd and Xps Characterizationsupporting
confidence: 57%
“…5b) can also be deconvoluted into three peaks as well as that of the polythiophene film, while the higher binding energy (163.69, 164.89 and 168.28 eV) is observed. This result indicates the strong interaction between polythiophene and titania through electron transfer from polythiophene to titania, or the formation of bonding between sulfur and oxygen [28]. While the PTh3/TNT and PTh5/TNT composites showed a similar pattern of their composition, the PTh5/TNT composite showed a higher ratio of S/Ti and also a higher level of the positively charged sulfur.…”
Section: Xrd and Xps Characterizationmentioning
confidence: 92%
“…Because of this process in polymers, the In concentration in the organic layer can be enhanced as compared to small molecule-based OLEDs. This mechanisms of ITO etching in the presence of polymers were confirmed using XPS depth profiling as well as Rutherford back scattering (RBS) on ITO|PEDOT:PSS (poly­(3,4-ethylenedioxythiophene):poly­(styrenesulfonate)) and other ITO|polymer interfaces. ,, Additional investigations on other interfaces like SnO 2 |polymer interfaces show that reduced ITO and SnO 2 interfaces may convert into pure metal ions or oxides, which will diffuse through the entire organic . The content of In in the organic layers is found to be nearly 0.1 at.…”
Section: Internal Degradation Mechanismsmentioning
confidence: 75%
“…197,221,365 Additional investigations on other interfaces like SnO 2 |polymer interfaces show that reduced ITO and SnO 2 interfaces may convert into pure metal ions or oxides, which will diffuse through the entire organic. 366 The content of In in the organic layers is found to be nearly 0.1 at. % (1:1000 In:C).…”
Section: Diffusion and Driftmentioning
confidence: 98%
“…Figure 5A shows S 2p peaks for unmodified P3HT thin film: S 2p 3/2 (163.4 eV) and S 2p 1/2 (164.2 eV) and is in agreement with the binding energy of S for P3HT. 22,28 The deconvolution of XPS spectra for P3HT−CdS sample shows the peaks corresponding to S 2p binding energies for CdS (161.8 and 163.2 eV) 29 and P3HT (163.8 and 164.8 eV) samples ( Figure 5B). The shifting of S 2P peaks toward higher binding energy (163.8 and 164.8 eV) than that of observed for unmodified P3HT further corroborate the formation of heterostructured P3HT−CdS.…”
Section: Resultsmentioning
confidence: 99%