The electrical conductivity of a CdS thin film, controlled by grain structures is essential to enhance its photoconductivity to be able to be fit as a window material in CdS/CdTe heterojunction solar cell. In order to characterize a thin film, electromagnetically, we employed an open cavity resonator with a sub-millimeter VNA (Vector Network Analyzer). Our technique is capable of measuring complex dielectric permittivity,ǫ, of a photovoltaic film as thin as 0.1 µm. We measured the real part of the complex dielectric permittivity, ǫ re , and electrical conductivity, σ re (derived from the imaginary part, ǫ im ), of unannealed and annealed CdS films with thicknesses ∼ 0.15 µm on ∼ 3 mm thick-borosillicate glass substrates, at room temperature. We obtain the (thermally activated) electrical conductivity between 100 and 312 GHz, which is less in annealed samples than in unannealed one by ∼ 2 orders of magnitude. Contrary to our expectations, the carrier concentrations extracted from these data by fitting a Drude model, are ∼ 10 16 cm −3 (unannealed) and ∼ 10 14 cm −3 (annealed). We investigate the connection between grain size and carrier concentration.Cadmium sulphide (CdS) is an integral component of CdTe/CdS heterostructured-thin solar cell where it is used as a window material for its better photoconductivity, optolelectronic properties, and flexibilty.1-3 Its photoconductivity sensitivity depends on its electronic properties. CdS is usually layered with cadmium telluride (CdTe) to make efficient solar cells.4,5 Cadmium sulphide (CdS) contains many intrinsic defect-states which affect its electronic conductivity profile. The grain structure can also plays a role. The microstructures of polycrystalline materials are composed of different orientedgrains.6,7 The grain boundaries are characterized by a potential barriers. The photoexcitation can impact transport through these grain boundaries by various mechanisms. The electrical conductivity is the key property in all these phenomena. This photovoltaic material can be grown with many different techniques, and dielectric properties are growth-technique dependent.The annealing-effects (in vacuum and under argon atmosphere) on the electrical and optical conductivity of CdS (deposited by chemical bath deposition method) have been studied in the temperature range 200-400 K. In the article by Oumous and Hadiri 8 , for temperatures > 300 K, the conduction is explained by the traps at the grain boundaries for grains partially depleted. On the other hand, for temperatures < 300 K, the conduction results from a hopping due to localized states.In order to evaluate the quality of materials used in CdS/CdTe photovoltaic heterojunctions, the complex dielectric properties of polycrystalline CdS, formed into a thin film by sputter-deposition onto Silicon (Si) wafers, were investigated by in situ spectroscopic ellipsometry.
9The authors focused on understanding the excited carriers by fitting their data to carrier scattering model. This is in optical frequency range (0.75 to 6.5 eV...