Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells

Sánchez, Luis Alberto Pomed; Moretón, A.; Guada, Miguel; Rodríguez-Conde, S.; Martı́nez, O.; González, Manuel Á.; Jiménez, J.

doi:10.1007/s11664-018-6381-8

Cited by 3 publications

(3 citation statements)

References 8 publications

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“…The wavelengths of excitation light are in the range of 400-1200 nm [29], [36,40,48,[54][55][56][57][58][59]. It allows the examination of monocrystalline and polycrystalline cells, perovskites, or silicon heterojunctions [55], [56,58,59]. To ensure the highest possible precision of the created bitmaps, a step of 0.1-25 μm is used [29,40,59].…”

Section: Light-beam-induced-current (Lbic)mentioning

confidence: 99%

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Imaging methods of detecting defects in photovoltaic solar cells and modules: a survey

Maziuk,

Jasińska,

Domaradzki

et al. 2023

Metrology and Measurement Systems

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In pursuit of increased efficiency and longer operating times of photovoltaic systems, one may encounter numerous difficulties in the form of defects that occur in both individual solar cells and whole modules. The causes of the occurrence range from structural defects to damage during assembly or, finally, wear and tear of the material due to operation. This article provides an overview of modern imaging methods used to detect various types of defects found in photovoltaic cells and panels. The first part reviews typical defects. The second part of the paper reviews imaging methods with examples of the authors' own test results. The article concludes with recommendations and tables that provide a kind of comprehensive guide to the methods described, depending on the type of defects detected, the range of applicability, etc. The authors also shared their speculations on current trends and the possible path for further development and research in the field of solar cell defect analysis using imaging.

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Section: Light-beam-induced-current (Lbic)mentioning

confidence: 99%

“…The following defects and inhomogeneities can be measured using the LBIC method: -recombination centres [40], -interconnection failures [40], -grain boundaries [58], -inappropriate shunts [58], -cell cracks [54,57],…”

Section: Light-beam-induced-current (Lbic)mentioning

confidence: 99%

Imaging methods of detecting defects in photovoltaic solar cells and modules: a survey

Maziuk,

Jasińska,

Domaradzki

et al. 2023

Metrology and Measurement Systems

View full text Add to dashboard Cite

show abstract

“…EL consists of luminescence emission by solar cells under forward bias, 10 thereby spatially resolving defects that affect the performance and/or durability of the modules, such as cracks, heterogeneous cell activity, failed soldering, grid defects, and dark areas in cells associated with dislocation clusters 11‐18 . In contrast, PL consists of luminescence emission under excitation with light 19‐28 . The difficulty involved in obtaining a uniform large‐area light excitation source over the module surface has prevented it from being applied to module inspection.…”

Section: Introductionmentioning

confidence: 99%

Daylight luminescence system for silicon solar panels based on a bias switching method

Guada

Moretón

Rodríguez-Conde

et al. 2020

Energy Science & Engineering

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Luminescence techniques, both electroluminescence (EL) and photoluminescence (PL), are becoming powerful tools for inspecting solar cells and photovoltaic modules, 1-7 based on the reciprocity relation between photovoltaic quantum efficiency and luminescence emission. 8,9 EL consists of luminescence emission by solar cells under forward bias, 10 thereby spatially resolving defects that affect the performance and/or durability of the modules, such as cracks, heterogeneous cell activity, failed soldering, grid defects, and dark areas in cells associated with dislocation clusters. 11-18 In contrast, PL consists of luminescence emission under excitation with light. 19-28 The difficulty involved in obtaining a uniform large-area light excitation source over the module surface has prevented it from being applied to module inspection. This problem was circumvented by using the sun as the excitation source, without having to resort to an artificial light source, for example, a laser. 19,29 PL emission depends on the quality of the material, its defects, for example, dislocations, precipitates, and cracks,

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Damage Characteristics Analysis of Laser Ablation Triple-Junction Solar Cells Based on Electroluminescence Characteristics

Guo,

Ye,

Chang

et al. 2024

Sensors

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To study the physical property effects of the laser on GaInP/GaAs/Ge solar cells and their sub-cell layers, a pulsed laser with a wavelength of 532 nm was used to irradiate the solar cells under various energy conditions. The working performance of the cell was measured with a source meter. The electroluminescence (EL) characteristics were assessed using an ordinary and an infrared camera. Based on the detailed balance theory, in the voltage characteristics of an ideal pristine cell, the GaInP layer made the most significant voltage contribution, followed by the GaAs layer, with the Ge layer contributing the least. When a bias voltage was applied to the pristine cell, the top GaInP cell emitted red light at 670 nm, the middle GaAs cell emitted near-infrared light at 926 nm, and the bottom Ge cell emitted infrared light at 1852 nm. In the experiment, the 532 nm laser wavelength within the response spectrum bands of the GaInP layer and the laser passed through the glass cover slip and directly interacted with the GaInP layer. The experimental results indicated that the GaInP layer first exhibited different degrees of damage under laser irradiation, and the cell voltage was substantially attenuated. The GaInP/GaAs/Ge solar cell showed a decrease in electrical and light emission characteristics. As the laser energy increased, the cell’s damage intensified, gradually leading to a loss of photoelectric conversion capability, the near-complete disappearance of red light emission, and a gradual degradation of near-infrared emission properties. The EL imaging revealed varying damage states across the triple-junction gallium arsenide solar cell’s sub-cells.

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Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells

Cited by 3 publications

References 8 publications

Imaging methods of detecting defects in photovoltaic solar cells and modules: a survey

Imaging methods of detecting defects in photovoltaic solar cells and modules: a survey

Daylight luminescence system for silicon solar panels based on a bias switching method

Damage Characteristics Analysis of Laser Ablation Triple-Junction Solar Cells Based on Electroluminescence Characteristics

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