“…Note, however, that luminescence imaging or mapping is of semiquantitative nature as luminescence intensity may strongly depend on further variables, such as quenching (Kempe and Götze, 2002;Nasdala et al, 2014) and sensitizing by other elements (e.g., Marfunin, 1979), effects of crystal orientation (e.g., Lenz et al, 2013) and the structural state/crystallinity, e.g., the accumulation of radiation damage due to the incorporation of radioactive U and Th (e.g., Lenz and Nasdala, 2015 and references therein). A potential (semi-) quantitative estimation of REE trace elements via luminescence intensity needs a broad range of carefully calibrated analytical conditions, e.g., standard material, system stability, and system response (Barbarand and Pagel, 2001;Habermann, 2002;Richter et al, 2003;Edwards et al, 2007;MacRae et al, 2012MacRae et al, , 2013.…”