Photoluminescence of ZnO thin films deposited at various substrate temperatures

Kao, K. C.; Shih, Wei-Che; Ye, Wei-Tsuen; Cheng, Da-Long

doi:10.1016/j.tsf.2015.09.033

Cited by 7 publications

(4 citation statements)

References 23 publications

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“…The FWHM value is associated with the dislocation density [ 11 , 41 ], with a larger value indicating the possibility of more dislocations in the films. Therefore, the ridge-like ZnO films show better crystallization than the particle-like films, indicating that the lateral coalescence of small grains greatly improve the crystallinity of ZnO films, which is consistent with previous results [ 11 , 14 , 15 , 31 ]. As temperature is one of the most important growth parameters, the BLI growth temperature was tuned from 250 to 450 °C, and the optimal temperature was found to be 315 °C.…”

Section: Discussionsupporting

confidence: 91%

Tuning the Surface Morphologies and Properties of ZnO Films by the Design of Interfacial Layer

Wang

Zhou

et al. 2017

Nanoscale Res Lett

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Wurtzite ZnO films were grown on MgO(111) substrates by plasma-assisted molecular beam epitaxy (MBE). Different initial growth conditions were designed to monitor the film quality. All the grown ZnO films show highly (0001)-oriented textures without in-plane rotation, as illustrated by in situ reflection high-energy electron diffraction (RHEED) and ex situ X-ray diffraction (XRD). As demonstrated by atomic force microscopy (AFM) images, “ridge-like” and “particle-like” surface morphologies are observed for the ZnO films grown in a molecular O2 atmosphere with and without an initial deposition of Zn adatoms, respectively, before ZnO growth with oxygen plasma. This artificially designed interfacial layer deeply influences the final surface morphology and optical properties of the ZnO film. From room-temperature photoluminescence (PL) measurements, a strong defect-related green luminescence band appears for the ZnO film with a “particle-like” morphology but was hardly observed in the films with flat “ridge-like” surface morphologies. Our work suggests that the ZnO crystallinity can be improved and defect luminescence can be reduced by designing interfacial layers between substrates and epilayers.Electronic supplementary materialThe online version of this article (10.1186/s11671-017-2301-8) contains supplementary material, which is available to authorized users.

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Section: Discussionsupporting

confidence: 91%

Tuning the Surface Morphologies and Properties of ZnO Films by the Design of Interfacial Layer

Wang

Zhou

et al. 2017

Nanoscale Res Lett

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“…[17], seven Gaussian curves were used to fit the spectra, each of which corresponding to various defects in ZnO nanostructures [17,27,38]. The peak in the UV range is derived from the bandedge emission (depicted as "exciton" emission for simplicity) [38,44]. The peak at 450-500 nm shows Zn-related defects, corresponding to transition between conduction band and Zn vacancies (VZn), interstitial Zn (Zni) to valence band, Zni and VZn [17,38].…”

Section: Resultsmentioning

confidence: 99%

“…17,27,38 The peak in the UV range is derived from the band-edge emission (depicted as ''exciton'' emission for simplicity). 38,44 The peak at 450-500 nm shows Zn-related defects, corresponding to transition between conduction band and Zn vacancies (V Zn ), interstitial Zn (Zn i ) to valence band, Zn i and V Zn . 17,38 The peaks around 505, 550, and 630 nm are the features of singly-charged oxygen vacancies (V þ O ), doubly-charged oxygen vacancies (V þþ O ) and surface defects, respectively.…”

Section: Resultsmentioning

confidence: 99%

ZnO nanorods prepared via ablation of Zn with millisecond laser in liquid media

Honda

Gotō

Owashi

et al. 2016

Phys. Chem. Chem. Phys.

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ZnO nanomaterials with controlled size, shape and surface chemistry are required for applications in diverse areas, such as optoelectronics, photocatalysis, biomedicine and so on. Here, we report on ZnO nanostructures with rod-like and spherical shapes prepared via laser ablation in liquid using a laser with millisecond-long pulses. By changing laser parameters (such as pulse width and peak power), the size or aspect ratio of such nanostructures could be tuned. The surface chemistry and defects of the products were also strongly affected by applied laser conditions. The preparation of different structures is explained by the intense heating of liquid media caused by millisecond-long pulses and secondary irradiation of already-formed nanostructures.

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“…Piezoelectric materials have been attracting considerable attention because of their potential applications for acoustic devices [1], micro motors [2], AFM cantilevers [3], UV detectors [4][5] or chemical sensors [6]. The most important parameter of piezoelectric materials is piezoelectric coefficient (d33).…”

Section: Introductionmentioning

confidence: 99%

Piezoelectric Response Evaluation of ZnO Thin Film Prepared by RF Magnetron Sputtering

et al. 2017

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Abstract.The most important parameter of piezoelectric materials is piezoelectric coefficient (d33). In this study, the piezoelectric ZnO thin films were deposited on the SiNx/Si substrate. The 4 inches substrate is diced into 8 cm× 8 cm piece. During the deposition process, a zinc target (99.999 wt%) of 2 inches diameter was used. The vertical distance between the target and the substrate holder was fixed at 5 cm. The piezoelectric response of zinc oxide (ZnO) thin films were obtained by using a direct measurement system. The system adopts a mini impact tip to generate an impulsive force and read out the piezoelectric signals immediately. Experimentally, a servo motor is used to produce a fixed quantity of force, for giving an impact against to the piezoelectric film. The ZnO thin films were deposited using the reactive radio frequency (RF) magnetron sputtering method. The electric charges should be generated because of the material's extrusion. This phenomenon was investigated through the oscilloscope by one shot trigger. It was apparent that all ZnO films exhibit piezoelectric responses evaluated by our measurement system, however, its exhibit a significant discrepancy. The piezoelectric responses of ZnO thin film at various deposition positions were measured and the crystal structures of the sputtering pressure were also discussed. The crystalline characteristics of ZnO thin films are investigated through the XRD and SEM. The results show the ZnO thin film exhibits good crystalline pattern and surface morphology with controlled sputtering condition. The ZnO thin films sputtered using 2 inches target present various piezoelectric responses. With the exactly related position, a best piezoelectric response of ZnO thin film can be achieved.

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Photoluminescence of ZnO thin films deposited at various substrate temperatures

Cited by 7 publications

References 23 publications

Tuning the Surface Morphologies and Properties of ZnO Films by the Design of Interfacial Layer

Tuning the Surface Morphologies and Properties of ZnO Films by the Design of Interfacial Layer

ZnO nanorods prepared via ablation of Zn with millisecond laser in liquid media

Piezoelectric Response Evaluation of ZnO Thin Film Prepared by RF Magnetron Sputtering

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