2013
DOI: 10.1063/1.4849855
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Photoluminescence, recombination rate, and gain spectra in optically excited n-type and tensile strained germanium layers

Abstract: We theoretically investigate the optical properties of photo-excited biaxially strained intrinsic and n-type doped Ge semi-infinite layers using a multi-valley effective mass model. Spatial inhomogeneity of the excess carrier density generated near the sample surface is considered. Strain effects on the band edges, on the band dispersions, and on the orbital compositions of the near gap states involved in radiative recombinations are fully taken into account. We obtain, as a function of the distance from the s… Show more

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Cited by 30 publications
(21 citation statements)
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“…From this fitting, we estimate the extracted recombination velocity for the Ge/Si interface to be less than 2×10 4 cm/s and the recombination velocity for the Ge/SiO 2 to be the range 1-5×10 3 cm/s. The recombination velocities for Ge/Si interface are in good agreement with those reported in [7,9]. The contribution to carrier recombination at Ge/SiO 2 sidewall layers can be suppressed in future devices by using better passivation coatings.…”
Section: Discussion and Resultssupporting
confidence: 79%
“…From this fitting, we estimate the extracted recombination velocity for the Ge/Si interface to be less than 2×10 4 cm/s and the recombination velocity for the Ge/SiO 2 to be the range 1-5×10 3 cm/s. The recombination velocities for Ge/Si interface are in good agreement with those reported in [7,9]. The contribution to carrier recombination at Ge/SiO 2 sidewall layers can be suppressed in future devices by using better passivation coatings.…”
Section: Discussion and Resultssupporting
confidence: 79%
“…Due to the fact that the Γ-valley energy reduces faster than the one of the L-valley, Ge transforms into a direct band gap semiconductor at ~4.7% uniaxial strain along [100] when the direct transition (black line) decreases below the energy of the indirect recombination (green line). For Ge under biaxial tensile strain or GeSn alloys, the band edges behave similarly with an indirect-to-direct band gap crossover at ~1.6-2.0% strain (El Kurdi et al, 2010;Virgilio et al, 2013;Wen and Bellotti, 2015) or and at a Sn-content of ~9% (Low et al, 2012;Gupta et al, 2013b;Wirths et al, 2015) for a fully relaxed layer.…”
Section: Band Structurementioning
confidence: 80%
“…The gain was calculated via Fermi's golden rule, assuming cylindrical symmetry for the valence bands to simplify the calculation of the joint density of states (JDOS), c.f. Virgilio et al (2013). More details of the calculation can be found in Süess et al (2013), supplementary information.…”
Section: Gainmentioning
confidence: 99%
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“…Bright emission can be explained via the compounding effects of strain-dependent gain enhancement, prohibitively large energy separations between the L and conduction band minima, and momentum contribution to the indirect L-valley light holes (lh) recombination path from exciton-generated longitudinal acoustic (LA) phonons [39]. In the former case, several theoretical [54][55][56] As/GaAs (sample C) under ε = 0.95% biaxial tensile strain depending on temperature; (b) experimental (circles) and calculated (triangles) peak energy (black line) and normalized integrated intensity (red line) versus temperature. [57,58] studies have demonstrated the effects of increasing tensile strain and doping concentrations on optical gain (or absorption) in Ge films.…”
Section: A Photoluminescencementioning
confidence: 99%