Characterization of Materials 2012
DOI: 10.1002/0471266965.com058.pub2
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Photoluminescence Spectroscopy

Abstract: This article presents a brief introduction to photoluminescence (PL) spectroscopy in solid‐state physics and technology, known as fluorescence spectroscopy in chemistry and biology. Though PL spectroscopy is usually known as spectral‐resolved spectroscopy, time‐resolved PL spectroscopy containing information about recombination lifetime of photoexcited electrons and holes has now become essential to the PL study on various materials ranging from nanoparticles to living tissues. Since a variety of methods of PL… Show more

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Cited by 6 publications
(3 citation statements)
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“…However, ARPES and STS measurements have not been established in these systems yet. Photoluminescence (PL) measurement [22,23] provides information about the optical properties of a material, including its excitation and emission spectra, which are essential for understanding the efficiency and performance of photovoltaic devices. So far, the PL measurement has been done for the case of orthorhombic CH(NH 2 ) 2 SnI 3 .…”
mentioning
confidence: 99%
“…However, ARPES and STS measurements have not been established in these systems yet. Photoluminescence (PL) measurement [22,23] provides information about the optical properties of a material, including its excitation and emission spectra, which are essential for understanding the efficiency and performance of photovoltaic devices. So far, the PL measurement has been done for the case of orthorhombic CH(NH 2 ) 2 SnI 3 .…”
mentioning
confidence: 99%
“…48 Photoluminescence spectroscopy.-PL spectroscopy is a nondestructive scientific methodology for displaying charge carrier movement and electron-hole recombination ability. [49][50][51] Bandgap changes if quantum confinement increased in photoluminescence. 52 Band gap is calculated by following formula Eg eV 1240 = ( )…”
Section: Lines Lenghtmentioning
confidence: 99%
“…The theoretical predictions in the current research could provide useful information for the experimental measurements. Up to now, the information about the optimal geometric, electronic, and optical properties of graphene-like related systems could be conrmed by high-technique equipment such as X-ray photoelectron spectroscopy (XPS), 80 scanning tunneling microscopy (STM), 81 scanning tunning spectroscopy (STS), 82 scanning tunning electron microscopy (STEM), 83 angle-resolved photoemission spectroscopy (ARPES), 84 photoluminescence spectroscopy (PL) 85 and other optical measurements. 86 Typically, XPS is a powerful technique to determine how many atoms are attached to the group IV monolayer and types of dopants, e.g., the estimated concentration for oxidized carbons and graphitic carbons.…”
Section: These Structures Originated From Vertical Excitations Withmentioning
confidence: 99%