2018
DOI: 10.1002/pssb.201800384
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Photoluminescence Study of B‐Trions in MoS2 Monolayers with High Density of Defects

Abstract: Photoluminescence spectroscopy has been used to investigate the details of B band emission from single‐layer MoS2 samples grown by chemical vapor deposition. The evolution of the peak shape upon variable excitation power is well described by a combination of exciton and trion contributions, from which B trion binding energy of 18 meV has been extracted. It has been suggested that the absence of accompanying A trion emission in our samples, as well as the enhanced intensity of the B band, can be ascribed to a f… Show more

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Cited by 25 publications
(17 citation statements)
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References 51 publications
(82 reference statements)
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“…Based on our results, we propose that when switching the device into HRS, the defects on the drain-side are forced to migrate towards the drain electrode from the fissure. Their depletion from the channel attenuates B exciton intensity which is usually associated with defect concentration [29,30]. Helium ion irradiation above doses of > 1 pC µm −1 results in V S concentrations [22] induced by beam sputtering that far exceed sub-stoichiometries achieved naturally by CVD growth [31].…”
Section: Visualising Defect Drift By Pl and Raman Spectroscopy Mappingmentioning
confidence: 99%
“…Based on our results, we propose that when switching the device into HRS, the defects on the drain-side are forced to migrate towards the drain electrode from the fissure. Their depletion from the channel attenuates B exciton intensity which is usually associated with defect concentration [29,30]. Helium ion irradiation above doses of > 1 pC µm −1 results in V S concentrations [22] induced by beam sputtering that far exceed sub-stoichiometries achieved naturally by CVD growth [31].…”
Section: Visualising Defect Drift By Pl and Raman Spectroscopy Mappingmentioning
confidence: 99%
“…In the case of WS 2 monolayers grown by chemical vapor deposition (CVD) onto Si/SiO 2 substrates, the A and B exciton peaks are usually detected at lower energies compared with the mechanically exfoliated layers or CVD‐grown layers on other substrates . This redshift is mostly caused by the strain in the as‐grown monolayers on the Si/SiO 2 substrate . In addition to the charge‐neutral A 0 exciton peak, a charged trion A peak is also often found at about 43 meV lower energies .…”
mentioning
confidence: 99%
“…Even though curve-fitting the PL to a set of Lorentzian functions is an accepted method by the majority of the TMD community, some researchers also use a combination of Lorentzian and Gaussian fitting functions. [152][153][154][155][156] This distribution does not have a closed-form solution and must be solved via numerical approaches, using the so-called "Voigt" function.…”
Section: Resultsmentioning
confidence: 99%
“…However, as lattice vibrations and defects start to perturb the exciton–phonon coupling, it adds a Gaussian component to the statistical distribution as well. Even though curve-fitting the PL to a set of Lorentzian functions is an accepted method by the majority of the TMD community, some researchers also use a combination of Lorentzian and Gaussian fitting functions. , This distribution does not have a closed-form solution and must be solved via numerical approaches, using the so-called “Voigt” function.…”
Section: Resultsmentioning
confidence: 99%