Defect characterization in 1.2 MeV Ar8+ irradiated polycrystalline ZnO has been carried out by x-ray diffraction (XRD), scanning electron microscopy (SEM) along with electrical resistivity, and photoluminescence (PL) measurements at room temperature (RT). Interestingly, irradiation with the initial fluence (1×1015 ions/cm2) changes the color of the sample from white to orange while the highest irradiation fluence (5×1016 ions/cm2) makes it dark reddish brown that appears as black. XRD study reveals no significant change in the average grain size of the samples with irradiation fluence. Increase in surface roughness due to sputtering is clearly visible in SEM with highest fluence of irradiation. RT PL spectrum of the unirradiated sample shows intense ultraviolet (UV) emission (∼3.27 eV) and less prominent defect level emissions (2–3 eV). The overall emission is largely quenched due to initial irradiation fluence. Increasing the fluence of Ar beam further, UV emission is enhanced along with prominent defect level emissions. Remarkably, the resistivity of the irradiated sample with highest fluence is reduced by four orders of magnitude compared to that of the unirradiated sample. This is due to an increase in donor concentration as well as their mobility induced by high fluence of irradiation. Change in color in the irradiated samples indicates dominant presence of oxygen vacancies. It is now well known that oxygen vacancies are deep donors in ZnO. So oxygen vacancies, in principle, are not the source of conductivity in ZnO at RT. Simultaneous evolution of coloration and conductivity in ZnO, as is seen in this study, indicate that oxygen vacancies strongly influence the stability of shallow donors, presumably zinc interstitial related (highly mobile Zn interstitials also need to form defect pair/complex to be stable), which act as major source of carriers. Such a contention is in conformity with most recent theoretical calculations.