2017
DOI: 10.1103/physrevb.96.035308
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Photon bunching reveals single-electron cathodoluminescence excitation efficiency in InGaN quantum wells

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Cited by 39 publications
(143 citation statements)
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“…Contrary to the work of Sapienza et al [2] where the LDOS is measured within the band gap of a dielectric- material photonic-crystal device, with the electron beam acting directly as a broadband dipole source, known as coherent excitation [15,16], our measurements should more likely originate from incoherent excitation consisting in the creation and relaxation of many electron-hole pairs down to the active material of the photonic structure, namely quantum wells (QWs)and subsequent radiative recombination [17]. In some cases coherent emission processes can also be observed above the semiconductor band gap emission [18] and photon correlation experiments then become necessary to identify the coherent and incoherent contributions to the signal [19].…”
mentioning
confidence: 46%
“…Contrary to the work of Sapienza et al [2] where the LDOS is measured within the band gap of a dielectric- material photonic-crystal device, with the electron beam acting directly as a broadband dipole source, known as coherent excitation [15,16], our measurements should more likely originate from incoherent excitation consisting in the creation and relaxation of many electron-hole pairs down to the active material of the photonic structure, namely quantum wells (QWs)and subsequent radiative recombination [17]. In some cases coherent emission processes can also be observed above the semiconductor band gap emission [18] and photon correlation experiments then become necessary to identify the coherent and incoherent contributions to the signal [19].…”
mentioning
confidence: 46%
“…InGaN/GaN MQW planar layers were grown on a c-plane sapphire substrate by metalorganic vapor phase epitaxy (MOVPE). 26 Densely packed nanorods were then fabricated using a top-down etching method, as previously reported. 8 Detailed layer stacks are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…As the beam current is known for a given data acquisition, τ e and γ can be determined independently from the g (2) data. 20 In this way, the excitation efficiency γ can be extracted for any position on the sample without a priori knowledge on the sample geometry, a major advantage in complex 3D semiconductor geometries as we will show.…”
mentioning
confidence: 98%
“…(See Figure 2 a.) The CL data have been calibrated using the method described in refs ( 20 ) and ( 24 ) using the known electron current (52 pA) as the input, yielding the average number of photons emitted per incident electron per unit bandwidth.…”
mentioning
confidence: 99%
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