Photon scanning tunneling microscope study of optical waveguides

Tsai, Din Ping; Jackson, Howard E.; Reddick, R. C.; Sharp, Steven; Warmack, R. J.

doi:10.1063/1.103160

Cited by 69 publications

(31 citation statements)

References 6 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A similar set-up, referred to as photon scanning tunneling microscope (PSTM), has been reported by Reddick et al [5] and Courjon et al [6]. The PSTM has been demonstrated in a spectroscopic mode [11] and applied to waveguides [12]. Although 5 nm lateral resolution has been claimed [6] caution should be taken in the interpretation of these images because of polarization effects and tip artifacts.…”

Section: Introductionmentioning

confidence: 99%

High resolution imaging of dielectric surfaces with an evanescent field optical microscope

Hulst

Segerink

Bölger

1992

Optics Communications

View full text Add to dashboard Cite

An evanescent field optical microscope (EFOM) is presented which employs frustrated total internal reflection on a localized scale by scanning a dielectric tip in close proximity to a sample surface. High resolution images of dielectric gratings and spheres containing both topographic and dielectric information have been obtained. The resolution obtained is 30 nm in the lateral directions and 0.1 nm in height depending on proper tip fabrication.

show abstract

Section: Introductionmentioning

confidence: 99%

High resolution imaging of dielectric surfaces with an evanescent field optical microscope

Hulst

Segerink

Bölger

1992

Optics Communications

View full text Add to dashboard Cite

show abstract

“…83,93,94 In direct analogy to STM, the photon scanning tunneling microscope (PSTM) was demonstrated, which detected the evanescent waves on the boundary of a prism under total internal reflection with a bare, tapered optical fiber. [95][96][97][98][99][100] Shortly after, researchers demonstrated similar apertureless SNOM systems that used a nanoscale tip probe instead of an aperture probe. [7][8][9][10][11][12][13][14] This type of microscope is often constructed from an AFM with a cantilever tip that is formed of either a dielectric, semiconductor, or metal.…”

Section: A Apertureless Snom Conceptmentioning

confidence: 99%

Review of near-field optics and superlenses for sub-diffraction-limited nano-imaging

2016

View full text Add to dashboard Cite

Near-field optics and superlenses for imaging beyond Abbe's diffraction limit are reviewed. A comprehensive and contemporary background is given on scanning near-field microscopy and superlensing. Attention is brought to recent research leveraging scanning near-field optical microscopy with superlenses for new nano-imaging capabilities. Future research directions are explored for realizing the goal of low-cost and high-performance sub-diffraction-limited imaging systems. © 2016 Author(s)

show abstract

“…NSOM studies of waveguides have demonstrated evanescent field decay [9], standing modes [10], and recently observed a modulation in the propagation direction [11] due to the Tien effect [12]. To the best of our knowledge, our measurements provide the first observation of standing modes in a single mode waveguide, as well as the first determination of all components of the propagation vector [13].…”

Section: Introductionmentioning

confidence: 63%

Measurement of internal spatial modes and local propagation properties in optical waveguides

Rhodes

Goldberg

Ünlü

et al. 1999

Applied Physics Letters

View full text Add to dashboard Cite

Near-field scanning optical microscopy has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector.Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The NSOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of perturbation of the NSOM probe on the measurement of the local field shows a weak but measurable perturbation, and the dependence on aperture and material parameters will be discussed.

show abstract

Photon scanning tunneling microscope study of optical waveguides

Cited by 69 publications

References 6 publications

High resolution imaging of dielectric surfaces with an evanescent field optical microscope

High resolution imaging of dielectric surfaces with an evanescent field optical microscope

Review of near-field optics and superlenses for sub-diffraction-limited nano-imaging

Measurement of internal spatial modes and local propagation properties in optical waveguides

Contact Info

Product

Resources

About