Photonic near-field imaging in multiphoton photoemission electron microscopy

Fitzgerald, J.P.S.; Word, Robert Campbell; Saliba, S. D.; Könenkamp, R.

doi:10.1103/physrevb.87.205419

Phys. Rev. B

2013

DOI: 10.1103/physrevb.87.205419

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Photonic near-field imaging in multiphoton photoemission electron microscopy

J.P.S. Fitzgerald

Robert Campbell Word

S. D. Saliba

et al.

Abstract: We report the observation of optical near fields in a photonic waveguide of conductive indium tin oxide (ITO) using multiphoton photoemission electron microscopy (PEEM). Nonlinear two-photon photoelectron emission is enhanced at field maxima created by interference between incident 410-nm and coherently excited guided photonic waves, providing strong phase contrast. Guided modes are observed under both transverse magnetic field (TM) and transverse electric field (TE) polarized illuminations and are consistent … Show more

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Cited by 25 publications

(35 citation statements)

References 29 publications

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“…These values are in good agreement with the known optical properties of ITO 19 and a detailed waveguide model as discussed in more detail in Ref. 15. Additionally, the Fourier transform shows clear signatures of the difference frequency mode and higher order modes in the signals labeled 3-6.…”

supporting

confidence: 84%

“…15. Fitting the model to the experimental data allows a determination of the coupling coefficients, B j /A, for the diffraction.…”

mentioning

confidence: 99%

“…We take as a first example the case of a transparent indium-tin-oxide film deposited on glass substrate. 15 The ITO is provided with a horizontal groove oriented perpendicularly to the incidence direction and a slightly depressed center area, both milled in a focused ion beam. At the groove, the excitation laser light is coupled into the film by diffraction.…”

mentioning

confidence: 99%

“…Applying waveguide theory, one can calculate the allowed guided modes and their associated effective refractive indices. [15][16][17][18] With this information, the observed interference pattern is completely determined. For a quantitative analysis, we describe the incident and diffracted waves as E inc ðy; tÞ ¼ A expðiðky sin h À xtÞÞ;…”

mentioning

confidence: 99%

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Direct imaging of optical diffraction in photoemission electron microscopy

Word

Fitzgerald

Könenkamp

2013

Applied Physics Letters

Self Cite

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We report the visualization of optical diffraction at the boundaries of semiconductor and metal nanostructures in non-linear photoemission electron microscopy. We observe light diffracting into photonic and plasmonic modes of planar samples, and into photonic vacuum modes above sample surfaces. In either case, the electron photoemission rate from the sample material is spatially modulated resulting in photoemission images with information on the electric field distribution at the sample/vacuum interface. The resolution in these images is typically ∼30 nm, i.e., significantly below the wavelengths of the exciting light. Optical phase shifts and absorption losses for the diffracted modes can be determined.

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supporting

confidence: 84%

“…15. Fitting the model to the experimental data allows a determination of the coupling coefficients, B j /A, for the diffraction.…”

mentioning

confidence: 99%

mentioning

confidence: 99%

mentioning

confidence: 99%

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Direct imaging of optical diffraction in photoemission electron microscopy

Word

Fitzgerald

Könenkamp

2013

Applied Physics Letters

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“…Our new results demonstrate the possibility of obtaining images with nanometer resolution for optical phenomena across the entire visible spectrum. These possibilities show PEEM to be an efficient tool for analyzing and modeling photon [3] and plasmon [5] dynamics and interactions at solid surfaces and devices. …”

mentioning

confidence: 99%

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

2015

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Photoemission Electron Microscopy (PEEM) provides a powerful tool for imaging electric fields and plasmon excitation. PEEM relies on the photoelectric effect with the photoemission yield directly dependent on the intensity of the electric field at the surface of the object being imaged. These properties provide valuable information about diffraction and interference as well as surface plasmon propagation and photo emission thresholds. High power pulse lasers allow for multiphoton PEEM where multiple photons are required in order to emit a single electron. These techniques produce images with resolution down to around 5nm in the visible and infrared regime [1]. It is therefore possible to directly image the near-field region of the electromagnetic field [2]. We report here, for the first time, the direct observation polarization dependent phase shifts in the in-coupling of light in the 780nm regime at the edge of a linear dielectric waveguide. Using finite element techniques we show that these phase shifts are correctly predicted. Furthermore the obtained photoemission micrographs allow a determination of optical properties on the nanometer scale, i.e. optical near-field distributions can be quantified and energy transfer and loss process can be analyzed. This opens the doors to sub-wavelength and dynamic imaging in metamaterial devices.In our experimental setup the substrate is a 0.2mm thick glass platelet covered by an indium-tin-oxide (ITO) layer approximately 290 nm thick. The greater refractive index of the ITO layer creates a twodimensional waveguide. An FEI Strata 237 focused ion beam was used to define a strip waveguide of 2 um width and milled 50nm into the ITO layer. In this strip waveguide only discrete set of modes can be excited. These modes create an interference pattern with the incident light. For the in-coupling of light into the guide a rectangular slit was milled at the edge of the strip waveguide in a direction perpendicular to the excitation light, as shown in Fig. (1) A general analysis of the waveguide performance has been carried out recently [3]. These results are extended here to include the nearinfrared region, where a 3-photon process is needed to generate a free photoelectron.By taking the Fourier transform of the intensity distribution along the length of the waveguide and extracting the periodic information (fig 2) we are able to determine distinct single modes for both TE and TM polarizations for 780nm illumination and calculate the effective indexes of refraction for these modes. The resulting effective indexes are 1.596 for TE and 1.544 for TM which translates to a thickness of approximately 250nm according to numerical calculations [4] (fig 3). Additional simulations are highly consistent with numerical calculations matching effective indexes to 0.2% error. Our new results demonstrate the possibility of obtaining images with nanometer resolution for optical phenomena across the entire visible spectrum. These possibilities show PEEM to be an efficient tool for analyzing and model...

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Light propagation and interaction observed with electrons

Word¹,

Fitzgerald²,

Könenkamp³

2016

Ultramicroscopy

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We discuss possibilities for a microscopic optical characterization of thin films and surfaces based on photoemission electron microscopy. We show that propagating light with wavelengths across the visible range can readily be visualized, and linear and non-linear materials properties can be evaluated non-invasively with nanometer spatial resolution. While femtosecond temporal resolution can be achieved in pump-probe-type experiments, the interferometric approach presented here has typical image frame times of ~200 fs.

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Photonic near-field imaging in multiphoton photoemission electron microscopy

Cited by 25 publications

References 29 publications

Direct imaging of optical diffraction in photoemission electron microscopy

Direct imaging of optical diffraction in photoemission electron microscopy

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

Light propagation and interaction observed with electrons

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