2018
DOI: 10.1063/1.4985584
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Photothermoelastic contrast in nanoscale infrared spectroscopy

Abstract: The contrast formation mechanism in nanoscale Infrared (IR) Spectroscopy is analyzed. The temperature distribution and elastic displacement across the illuminated T-shape boundary between two materials with different IR-radiation absorption coefficients and thermo-physical and elastic properties located on a rigid substrate are calculated self-consistently for different frequencies f ∼ (1 kHz–1 MHz) of IR-radiation modulation (fully coupled problem). Analytical expressions for the temperature and displacement … Show more

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Cited by 10 publications
(28 citation statements)
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“…Morozovska et al propose that the width of such a step (δw) is the limiting factor for spatial resolution of photothermal measurements. 15 Their model predicts the frequency dependence of spatial resolution and provides values of δw that are qualitatively comparable to those expected in the thermal wave propagation limit by Bozec et al (Equation (1)). 14 It is interesting to examine the relationship between the spatial resolution of PTIR measurements and direct measurements of temperature increase in the sample.…”
Section: Spectromicroscopy Resolution and Thermal Wave Propagationsupporting
confidence: 65%
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“…Morozovska et al propose that the width of such a step (δw) is the limiting factor for spatial resolution of photothermal measurements. 15 Their model predicts the frequency dependence of spatial resolution and provides values of δw that are qualitatively comparable to those expected in the thermal wave propagation limit by Bozec et al (Equation (1)). 14 It is interesting to examine the relationship between the spatial resolution of PTIR measurements and direct measurements of temperature increase in the sample.…”
Section: Spectromicroscopy Resolution and Thermal Wave Propagationsupporting
confidence: 65%
“…The bulk mechanical and thermal properties of PMMA and epoxy in our sample are similar or identical 15 and their variation is expected to provide a small or negligible contribution to the contrast observed in the images of Figure 3 and Figure 4. However, despite the homogenous bulk properties of the sample, some unexpected features are observed in the PTIR images in Figure 3.…”
Section: Imaging Resolutionmentioning
confidence: 54%
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“…Recently, atomic force microscopy-based nanoscale infrared spectroscopy (AFM-IR), for which the highest spatial resolution of 10 nm can be achieved, was developed by Dazzi et al. 21–24 and has been applied to various types of systems 2147 including polymer-metal interfaces. 26–31 The AFM-IR utilizes a sharp AFM probe with a typical tip radius of several tens of nanometers to detect local photothermal expansion of a sample surface induced by absorption of infrared (IR) irradiation, and its spatial resolution depends on the thermal expansion area detected by the apex of an AFM probe tip.…”
Section: Introductionmentioning
confidence: 99%
“…(ii) The spatial resolution depends not only on the tip size but also on the sample thermomechanical properties which will become dominant for thick samples and can deteriorate the lateral spatial resolution. 24,25 (iii) A theoretical result is also reported that the spatial resolution possibly deteriorates when the thermal conductivity of a substrate is lower or a sample is thicker, 38 although the model does not reproduce the rapid impulsive excitation in AFM-IR. (iv) Thin samples are also advantageous for quantitative measurements.…”
Section: Introductionmentioning
confidence: 99%