1998
DOI: 10.1016/s0927-0248(97)00280-8
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Photovoltaic device applications of porous microcrystalline silicon

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Cited by 14 publications
(4 citation statements)
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“…The increase in the photocurrent indicates higher short-circuit current and higher conversion efficiency will be obtained by application of the TLPS structures. At a reverse bias of 5 V, the TLPS device has about one-order higher photocurrent than that of one based on a single LP-PS layer with porosity of 40%, which was applied as the surface film in a Si-based solar cell to achieve optimum device performance [ 8 ]. That imply that the TLPS structures have good potential to improve the performance of a Si-based photovoltaic device.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The increase in the photocurrent indicates higher short-circuit current and higher conversion efficiency will be obtained by application of the TLPS structures. At a reverse bias of 5 V, the TLPS device has about one-order higher photocurrent than that of one based on a single LP-PS layer with porosity of 40%, which was applied as the surface film in a Si-based solar cell to achieve optimum device performance [ 8 ]. That imply that the TLPS structures have good potential to improve the performance of a Si-based photovoltaic device.…”
Section: Resultsmentioning
confidence: 99%
“…In most of the related research, PS films acted as the surface texturing and anti-reflection (AR) layers to reduce the light-reflection losses or as the surface passivation layers to decrease surface carrier recombination velocity. On the other hand, PS can potentially serve as the parts of the active layer to effectively generate photo-induced carriers because of its wide energy bandgap and high photoconduction in response to solar irradiation [ 8 , 9 ]. However, a primary drawback of PS for use of the light-absorption layer in a photovoltaic device is its comparatively narrow spectral photoresponses.…”
Section: Introductionmentioning
confidence: 99%
“…The FTIR spectra of PSi samples are shown in Figure ( 6) FTIR spectra of Si bulk for (111), whereas Figure ( 7) FTIR shows a PSi sample with current density 10, 20 and 40 mA/cm 2 sequential at etching time 20 min , HF 15%, and HF 30% for (100). Moreover, Figure (8) shows FTIR spectra for PSi sample with HF15% at etching time 20min and current density 10 mA/cm 2 for (100) and (111) of transmittance peak IR and chemical [32].…”
Section: Chemical Properties Of Psimentioning
confidence: 99%
“…In 1997, Smith et al [7] reported a blue shift in metal/PSi/c-Si structures compared to that of c-Si based photodetectors. Then, the rapid thermal oxidation method was used to develop a high-gain photodetector of PS planar metal-semiconductormetal by Duttagupta in 1998 [8]. Moreover, Coulthard et al in 2000 [9] prepared PS samples by electrochemical etching and then studied the PL of the PSi samples using a synchrotron as a tuneable excitation source.…”
Section: Introductionmentioning
confidence: 99%