Directly written embedded structures created within fused silica by a femtosecond Ti:sapphire laser are observed to strongly reflect blue light. Reflection emerges only in a direction parallel to the polarization axis of the writing laser. This anisotropic-effect is caused by a periodic modulation of refractive index of amplitude ⌬nϳ10 Ϫ2 with a characteristic period ⌳ϳ150 nm over a spot size ϳ1.5 m. We show that the origin of the anisotropic reflection is the primary cause of other anisotropic phenomena reported in recent experiments. © 2002 American Institute of Physics. ͓DOI: 10.1063/1.1492004͔The use of a femtosecond laser source to directly write structures deep within transparent media has recently attracted much attention due to its simplicity compared to lithographic methods, and its capability for writing in three dimensions. [1][2][3] Tight focusing of the laser into the bulk of material causes nonlinear absorption only within the focal volume, depositing energy that induces a permanent material modification. 4,5 A variety of photonic devices have already been created by translating a sample through the focus of a femtosecond laser. 6,7 Although molecular defects caused by such intense irradiation have been identified in fluorescence, electron-spin resonance and other studies, 8 the mechanism of induced modifications in glass is still not fully understood. Moreover, such structures in Ge-doped silica 9 and other glass materials 10 show an unexpected anisotropic light scattering which is dependent on the plane of light polarization. This has been interpreted in terms of photoelectrons moving along the direction of light polarization inducing index inhomogenities. More recently, uniaxial birefringence imprinted in structures written within fused silica plates has been observed but the origin of this anisotropic phenomenon remains a mystery. 11 In this letter, we will describe a further anisotropic property observed in silica after being irradiated by a femtosecond laser-strong reflection from the modified region occurring only along the direction of polarization of the writing laser. Our analysis suggests that this effect is also the primary cause of all previously reported anisotropic phenomena.A regeneratively amplified mode-locked Ti:sapphire laser ͑150 fs pulse duration, 250 kHz repetition rate͒ operating at ϭ850 nm was used to directly write microstructures into a fused silica plate (40ϫ40ϫ1 mm). In the experimental arrangement ͑Fig. 1͒, the collimated laser passes through an electronic shutter, variable neutral density filter and halfwave plate before a dichroic mirror reflecting only in the 400-700 nm region. The infrared laser light travels through the mirror and is focused through a 50 ϫ(numerical apertureϭ0.55) objective into the bulk of the sample, down to a beam waist diameter estimated to be ϳ1.5m. The silica sample is mounted on a computer-controlled linear-motor three-dimensional translation stage ͑of 20 nm resolution͒. To simultaneously observe the writing process, a charge coupled device...