“…Our group reported the highly oriented structure of Nafion thin films on SiO x [34], MgO [35,36], sputtered Pt [37], and sputtered Au [36] surfaces by infrared p-polarized multiple-angle incidence resolution spectrometry (pMAIRS), which was developed by Hasegawa and co-workers [38][39][40], as presented in Figure 2(a-d). IR pMAIRS offers the molecular orientation for each functional group to various functional materials such as derivatives of polythiophene [41,42], porphyrin [43], pentacene [44], fullerene [45], naphthalene diimide [46], phthalimide [47], azulene [48], metal-oxide nanowire [49], polymer brushes [50], and polyimide [51]. Because this spectroscopic method is an infrared spectroscopic method, it is useful because it is applicable to non-crystalline materials.…”