The impact was examined of surface ordering of 50 nm-thick copper phthalocyanine (CuPc) layers on the layer's susceptibility to ambience-induced degradation processes. The surface morphology of CuPc layers obtained by physical iapor deposition with different deposition rates, 0.01 nm/s (r 1 ) and 0.02 nm/s (r 2 ), was diagnosed applying atomic force and scanning electron microscopes. The images exhibited compact, ordered surface topography with crystallites of homogeneous geometry for a layer with r 1 while randomly distributed bigger crystallites on a rougher and more expanded surface for a layer with r 2 . X-ray diffraction reiealed the α-form of phthalocyanine, mostly with an orientation of the a axis perpendicular to the substrate plane. Mean grain size in bulk was slightly larger for CuPc with r 2 . . Energy dispersiie X-ray spectroscopy demonstrated an increase of C/Cu and N/Cu elemental ratios compared to the expected composition for both layers but significantly more pronounced for layer with r 2 . Morphological features and traces of CuPc-air interaction were mirrored also in the Raman spectra. Samples with r 2 exhibited an increased peak width, and their peaks were shifted compared to samples with r 1 , which was attributed to surface disorder. The Raman spectra exhibited the appearance of additional peaks of oxidation products indicating C-O-C, C=O and N-O bonds, with intensities coinciding to an increased carbon and nitrogen content. More intensiie peaks were recorded for layers obtained with higher deposition rate, proiing their stronger susceptibility to eniironment-induced degradation processes.