2022
DOI: 10.1002/er.7843
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Physical engineering of anti‐solvents in perovskite precipitation for enhanced photosensitive affinity

Abstract: Summary For the development of the perovskite formation process, it is necessary to explore the principle of fabricating the photosensitive layer. Herein, a novel perspective on the physical properties of anti‐solvents is proposed, which is related to perovskite crystallization. Specifically, we focus on aromatic solvents with different functional groups as anti‐solvents (methylbenzene (MB) and chlorobenzene (CB)). This is because the precursor solubility depends on the interactions with each solvent, which is… Show more

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Cited by 3 publications
(2 citation statements)
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“…Since the grain boundaries are pathways for electrons to pass through, the ethyl ether-treated PD showed a higher shunt leakage current than the other PDs with small grains . The toluene-treated device exhibited a smaller resistance than the devices treated with the other two washing solvents, which resulted from the relatively thin structure with larger grains than the CB-treated perovskite grains …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Since the grain boundaries are pathways for electrons to pass through, the ethyl ether-treated PD showed a higher shunt leakage current than the other PDs with small grains . The toluene-treated device exhibited a smaller resistance than the devices treated with the other two washing solvents, which resulted from the relatively thin structure with larger grains than the CB-treated perovskite grains …”
Section: Resultsmentioning
confidence: 99%
“…35 The toluene-treated device exhibited a smaller resistance than the devices treated with the other two washing solvents, which resulted from the relatively thin structure with larger grains than the CB-treated perovskite grains. 36 Dark current was generated by the charge injection current along the main junction as well as the shunt leakage current. 37,38 The charge injection current can be identified from the slope after the shunt leakage region in Figure 5a.…”
Section: ■ Results and Discussionmentioning
confidence: 99%