Physical nature of degradation of light-emitting diodes and semiconductor lasers

The stability of electrical parameters of CdTe layers produced by metal - organic chemical vapour deposition

“…C R C S (7) hold during the measurements of the structure parameters then the expressions (3) and ( 4) are simplified and allow 5)-( 7) are fulfilled strictly at 'low' frequencies. Since (see section 2) the frequency dependence of the capacitance is flat at f > 5 kHz up to 'high' frequencies for the initial structures and the magnitude of the measured capacitance in this frequency range is close to C R , we can deduce that the conversion which is well earthed at 'low' frequency also works at 'high' frequency, at least for capacitance measurements.…”

“…They changed under AWTs, but, as one can see, these changes did not affect the character of the dependence. The value of the structure capacitance C e at 'high' frequency, which is a sensitive indicator of the fulfilment of relations ( 5)- (7), remained slightly reduced relative to C R after AWTs (figure 2(b), •). Therefore conditions ( 5)- (7) apparently applied throughout our study for this sample.…”

“…The value of the structure capacitance C e at 'high' frequency, which is a sensitive indicator of the fulfilment of relations ( 5)- (7), remained slightly reduced relative to C R after AWTs (figure 2(b), •). Therefore conditions ( 5)- (7) apparently applied throughout our study for this sample. Let this assumption be the basis of the analysis for sample 2.…”

“…Some of these defects may diffuse from the substrate to the epilayer, causing a change in its electrical parameters. So, acoustic-wave treatment (AWT), to some extent, simulates the processes of degradation in the structure [7], producing the condition for studying the stability of the layer's parameters in a relatively short time interval.…”