2017 IEEE International Electron Devices Meeting (IEDM) 2017
DOI: 10.1109/iedm.2017.8268446
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Physics and technology of electronic insulator-to-metal transition (E-IMT) for record high on/off ratio and low voltage in device applications

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Cited by 8 publications
(11 citation statements)
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“…The IMT strength can be controlled by substrate temperature during film deposition, oxygen partial pressure during growth, and the choice of substrates (Savo et al, 2015 ). In this study, we used a VO 2 thin film with IMT strength of 2 × 10 5 (Lin et al, 2017 ).…”
Section: Methodsmentioning
confidence: 99%
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“…The IMT strength can be controlled by substrate temperature during film deposition, oxygen partial pressure during growth, and the choice of substrates (Savo et al, 2015 ). In this study, we used a VO 2 thin film with IMT strength of 2 × 10 5 (Lin et al, 2017 ).…”
Section: Methodsmentioning
confidence: 99%
“…A “neck-down” design for the contact were used as illustrated in Figure 1B . The neck-down device drives only a small volume of the VO 2 into transition and reduces the voltage required to trigger the transition (Lin et al, 2017 ). In our experiment, the variation in material property is limited.…”
Section: Methodsmentioning
confidence: 99%
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“…Phase change materials showing metal-insulator transition (MIT), especially VO2 15 , have been widely explored as a platform to achieve electrical oscillations [15,16], often with oscillation frequency up to 9 MHz [17] and operation voltage below 1 V [18]. VO2 undergoes a concomitant first-order structural [19] and electrical transition [20] with a large 5 orders of magnitude change in the electrical conductivity at 68°C in bulk single crystals [21].…”
Section: Introductionmentioning
confidence: 99%