2022
DOI: 10.1088/1361-6595/ac734d
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Physics of thermionic orificed hollow cathodes: II. Scaling laws and design rules

Abstract: Scaling laws for the total pressure, electron temperature, and attachment length within orificed hollow cathodes are derived from a theoretical zero-dimensional model combined with a charge-exchange-limited ambipolar diffusion model. These quantities are critical as they control the operational life of thermionic hollow cathode inserts. The underlying models were delineated and evaluated experimentally in a companion paper (Part 1). In the present paper, scaling laws are derived from first principles for the t… Show more

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Cited by 3 publications
(8 citation statements)
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“…For the linear fit of ln n e with parameters β0 and β1 , we have Example of the derivation of the attachment length from an experimentally measured electron density profile. Experimental data from [9] for the NSTAR discharge cathode operating at 15 A. Reproduced with permission from [33].…”
Section: Attachment Lengthmentioning
confidence: 99%
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“…For the linear fit of ln n e with parameters β0 and β1 , we have Example of the derivation of the attachment length from an experimentally measured electron density profile. Experimental data from [9] for the NSTAR discharge cathode operating at 15 A. Reproduced with permission from [33].…”
Section: Attachment Lengthmentioning
confidence: 99%
“…Cathodes operating at lower current have undergone life tests of up to 50 kh [26]. Higher-current cathodes capable of providing up to 300 A of discharge current have been developed [28,33], with estimated lifetimes of 10 to 20 kh for those developed by Goebel and Chu [28]. Because life tests are both time-consuming and costly, there is a clear need for the development of methods that can accurately predict the operational life of hollow cathodes.…”
Section: Introductionmentioning
confidence: 99%
“…Gray areas on the model indicate the minimum and maximum values obtained for the indicated cathodes, with sheath voltage and gas temperature with values between 1-10 V and 2000-4000 K, respectively. Adapted with permission from [67] Copyright 2020, Pierre-Yves C. R. Taunay. electron fluxes is likely captured within the range of sheath potentials considered. Although the scaling is likely captured, we caution that, because of the exponential dependence of the random electron flux (i.e.…”
Section: Wall Temperaturementioning
confidence: 99%
“…(e) PLHC. Adapted with permission from [67] Copyright 2020, Pierre-Yves C. R. Taunay. higher than the typical application range of barium-based emitters.…”
Section: Wall Temperaturementioning
confidence: 99%
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