2006
DOI: 10.1063/1.2364136
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Physics of ultrathin photovoltaics

Abstract: The authors consider physical properties of ultrathin photovoltaics with thickness (≲1μm) smaller than both the depletion width and diffusion length, applicable to the cases of amorphous, polycrystalline, and nanostructured devices. Three phenomena underlie the unique physics of such systems: (1) lateral screening by conducting electrodes, (2) leakiness due to defect assisted tunneling, and (3) gigantic capacitive energy conducive to shunting breakdown. The authors give numerical estimates and discuss practica… Show more

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Cited by 11 publications
(6 citation statements)
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“…In this case, the SCR is reduced by the forward biasing and the BC region can slightly increase. This is in agreement with all the conceptual studies in literature and the physical theory considered above [1,14]. The reverse bias diminishes the W b by extending the SCR, whereas the forward bias reduces the strength of F and creates a back barrier at the BC.…”
Section: Simulation Results and Discussionsupporting
confidence: 91%
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“…In this case, the SCR is reduced by the forward biasing and the BC region can slightly increase. This is in agreement with all the conceptual studies in literature and the physical theory considered above [1,14]. The reverse bias diminishes the W b by extending the SCR, whereas the forward bias reduces the strength of F and creates a back barrier at the BC.…”
Section: Simulation Results and Discussionsupporting
confidence: 91%
“…The thickness of such devices (d) is comparable with the width of SCR (W) and carrier diffusion length (L n ). Karpov et al [1] have studied the unique physics of ultrathin photovoltaics (PV) by assuming W [ d. They considered that an ultrathin device resembles a capacitance with a dielectric inside it. In another approach, Kosyachenko and Toyama [2] have analysed the thin-film devices with d = 2.7 lm and showed that the influence of BC on the carrier transport in SCR can be ignored if the concentration of uncompensated acceptors, N ad = 5 9 10 15 cm -3 , and the depletion widths of SCR (W = 0.6-0.8 lm) do not overlap with the depletion width of the BC (W b = 0.2 lm).…”
Section: Introductionmentioning
confidence: 99%
“…Reverse bias measurements from p-i-n and p-n diodes also show markedly different behaviour: the p-i-n diode breaks down at much larger reverse-bias voltage (approximately 27 V) than the p-n diode (approximately 21 V) for all temperatures studied. In addition, the reverse-bias breakdown voltage of the p-n diode increases with decreasing temperature, which is consistent with a Zener (tunneling) breakdown mechanism, whereas the breakdown voltage of the p-i-n structures exhibits little temperature dependence, suggesting contributions from tunneling and avalanche mechanisms [11] Overall, these results indicate that tunneling or leakage currents are more significant in the p-n diode [12], and that the diode quality factor and breakdown behavior are readily controlled during nanowire growth by the introduction of the i-layer as in planar structures [13,14].…”
Section: Resultsmentioning
confidence: 57%
“…The transport properties are calculated using the drift diffusion model. using such a semi-classical approach for the nanowire size considered in this work has been discussed in [11], [12]. In the calculation, we enabled the Shockley-Read-Hall recombination and concentration dependent mobility.…”
Section: Nanowire Modelingmentioning
confidence: 99%
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