“…In situ measurements of the thickness of these films could be important to test the model of thickness changes during compression used in such studies (Chen et al, 2011;Hsieh et al, 2017Hsieh et al, , 2018Hsieh et al, , 2020Marzotto et al, 2020). Likewise, in situ measurement of thickness of metal films on substrates could be important to test the isotropic model of thickness change assumed in picosecond acoustics experiments (Decremps et al, 2014;Edmund et al, 2020). Sample thickness is also essential for the spectroscopic determination of optical absorption coefficients, which serve as primary input for estimates of radiative thermal conductivity (Goncharov et al, 2006(Goncharov et al, , 2008(Goncharov et al, , 2015Keppler et al, 2008;Lobanov et al, 2017Lobanov et al, , 2020Lobanov et al, , 2021Murakami et al, 2014Murakami et al, , 2022Thomas et al, 2012).…”