2024
DOI: 10.1126/sciadv.adn8980
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Picosecond carrier dynamics in InAs and GaAs revealed by ultrafast electron microscopy

Christopher Perez,
Scott R. Ellis,
Francis M. Alcorn
et al.

Abstract: Understanding the limits of spatiotemporal carrier dynamics, especially in III-V semiconductors, is key to designing ultrafast and ultrasmall optoelectronic components. However, identifying such limits and the properties controlling them has been elusive. Here, using scanning ultrafast electron microscopy, in bulk n-GaAs and p-InAs, we simultaneously measure picosecond carrier dynamics along with three related quantities: subsurface band bending, above-surface vacuum potentials, and surface trap densities. We … Show more

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Cited by 6 publications
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