Picosecond electrical sampling using a scanning force microscope

Hou, A. S.; Ho, F.; Bloom, D. M.

doi:10.1049/el:19921481

Cited by 119 publications

(35 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The stroboscopic, or "pump-probe" method as it is traditionally named by the optics community, has been grafted onto many different varieties of microscopy, including electron beam, scanning probe (force and tunneling), and, of course, optical (both conventional and near-field) [1,2,3,4]. Some applications of ultrafast optical microscopy are more fully developed than ultrafast scanning probe microscopies, many of which are still not too far beyond the "proof-of-principle" stage.…”

Section: Historical Overviewmentioning

confidence: 99%

Stroboscopic Microscopy of Magnetic Dynamics

Freeman

Hiebert

Topics in Applied Physics

View full text Add to dashboard Cite

Abstract. The enhanced capabilities of contemporary pulsed light sources have led to the reflourishing, in recent years, of ultrafast imaging of micromagnetic dynamics. Concurrently, interest in the subject has been intensified by other factors, such as the emergence of intrinsic magnetic response times as a potential limitation to the ultimate bandwidth of magnetic data storage and by increasingly powerful computer models of magnetic dynamics which call for experimental comparisons. This review contains a discussion of the experimental details behind ultrafast timeresolved magneto-optic imaging, sandwiched between a brief historical overview and a presentation of some recent results, and accompanied by an outline of some future prospects. Historical OverviewThe ongoing development of ultrafast laser technologies has made stroboscopic imaging of fast dynamics in microscopic structures very convenient. The stroboscopic, or "pump-probe" method as it is traditionally named by the optics community, has been grafted onto many different varieties of microscopy, including electron beam, scanning probe (force and tunneling), and, of course, optical (both conventional and near-field) [1,2,3,4]. Some applications of ultrafast optical microscopy are more fully developed than ultrafast scanning probe microscopies, many of which are still not too far beyond the "proof-of-principle" stage. This is largely because the development time for an ultrafast optical microscope is much shorter than that for combinations of ultrafast lasers with other imaging methods.Magnetic structures in particular have provided a major test bed for developments in ultrafast optical microscopy. The magneto-optic activity of ferromagnetic materials ideally suits them for this kind of experimental analysis. With characteristic relaxation times and oscillation periods ranging into the low picosecond range, and with domain wall widths and spin-wave wavelengths in the nanometer range, spatiotemporal investigation of these materials poses a difficult challenge for any type of microscopy. Ferroelectrics are another class with similar characteristics [5].As is often the case, the territory we explore now and find so fertile turns out to have been well surveyed by our predecessors, using the best tools of

show abstract

Section: Historical Overviewmentioning

confidence: 99%

Stroboscopic Microscopy of Magnetic Dynamics

Freeman

Hiebert

Topics in Applied Physics

View full text Add to dashboard Cite

show abstract

“…The HFSEFM technique invented by Bloom and Kubalek [18][19][20][21] has proven to be the most versatile one up to now. The potential distribution of the device under test (DUT) is monitored via the Coulomb force between the biased tip and the DUT in the dynamic mode.…”

Section: Probes For Hfsefmmentioning

confidence: 99%

Novel probes for scanning probe microscopy

Oesterschulze¹

1998

Applied Physics A: Materials Science & Processing

View full text Add to dashboard Cite

Cantilever probes for scanning probe microscopy (SPM) applications are fabricated in almost any case from (100) silicon wafers. Although the probes show excellent mechanical properties which make silicon cantilevers appropriate for topography imaging by scanning force microscopy (SFM), modern SPM applications force the search for novel materials with specific material properties which would be of advantage in SPM. In this paper several concepts for SPM probes are described which make use of specific properties of gallium arsenide, diamond and various metals. Different sensor concepts, e.g. in the tip integrated Schottky diode, coplanar waveguide lines integrated on a cantilever probe, etc., are introduced. They are designed for imaging of thermal, electrical, and optical sample surface properties exploiting the unique properties of the above-mentioned materials.Since the invention of scanning force microscopy (SFM) by Binnig et al. in 1986 [1], scanning probe microscopy (SPM) has been demonstrated to be a intriguing tool for highresolution imaging of various physical surface properties [2]. In particular, the cantilever probe concept introduced for SFM has proven to be the most versatile and flexible one available so far. A prerequisite for SFM is the fabrication of probes with reproducible properties, e.g. resonance frequency, force constant, tip shape, and radius of curvature of the tip [3]. Until today the material used for probe fabrication has been almost exclusively (100)-oriented Si (or silicon nitride) because of the well-established micromachining techniques known from semiconductor technology.The most important aspect regarding the potential of SPM is the possibility to integrate various sensors in a single probe. This allows us to image additional physical quantities besides the surface topography. To achieve this aim, novel probe concepts have to be developed and realized by reproducible technological processes. Although the mechanical properties of silicon are quiet excellent with respect to SFM, in modern applications of SPM other probe properties, e.g. electrical, thermal, optical, magnetic, etc., are decisive. For this reason novel materials with specific physical properties have to be considered to optimize probe sensitivity as well as to find new applications.In the first section of the paper it is demonstrated that not only Si, but also GaAs, diamond, and thin metal filmsmaterials with unique physical properties -are appropriate materials. Technological processes will be described which allow batch processing of these materials for probe fabrication. In the second part of the paper the material properties are considered -a significant point for the development of novel active and passive SPM probes.We report on the design and micromachined fabrication of near-field probes for high-frequency scanning electrical force microscopy (HFSEFM), scanning thermal microscopy (SThM), and scanning near-field optical microscopy (SNOM). Probe concepts and fabrication processes presented include the possibilit...

show abstract

“…There were several pioneering studies to detect high-speed physical and/or chemical phenomena even at the early stage of the EFM/KFM development. For example, high-frequency response in the GHz range was converted into the detectable frequency range using the heterodyne sampling by mixing 2 different frequencies [7,8]. However, the technique of the tip-sample distance regulation at that time was not sufficiently developed and the obtained resolution was relatively low.…”

Section: High-speed Electric Force Measurementmentioning

confidence: 99%

Present status and future prospects of electric force microscopy

Yamada

2017

NOLTA

View full text Add to dashboard Cite

Electric force microscopy (EFM) and Kelvin probe force microscopy (KFM) have been widely used for studying electrical properties of nanometer-scale structures. Since they were invented at the early stage of atomic force microscopy (AFM) history, both techniques have been drastically developed with dynamic-mode AFM, where the cantilever is used as a mechanical oscillator. They are capable of mapping local work function and electronic states of a wide variety of material surfaces on an atomic/molecular scale. Here in this article we review the present status of EFM and KFM mainly based on frequency modulation AFM and discuss the future prospects.

show abstract

Picosecond electrical sampling using a scanning force microscope

Cited by 119 publications

References 0 publications

Stroboscopic Microscopy of Magnetic Dynamics

Stroboscopic Microscopy of Magnetic Dynamics

Novel probes for scanning probe microscopy

Present status and future prospects of electric force microscopy

Contact Info

Product

Resources

About