Piezo- and pyroelectricity in Zirconia: a study with machine learned force fields

Ganser, Richard; Simon, Bongarz,; Alexander, von Mach,; Antunes, Luis Azevedo; Kersch, Alfred

doi:10.48550/arxiv.2206.00540

Cited by 1 publication

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“…[86] This might be an indication of the lower fraction of the polar orthorhombic phase in the thick CSD-grown films. Then it could be assumed that the measured PFM response is a convolution of responses both from polar and nonpolar phases (nonpolar tetragonal phase has a positive d 33,eff sign [96] ). Additionally, charge injection could affect the measured PFM signal as well.…”

Section: Thickness Effect On the D 33eff Sign In La:hfo 2 -Based Capa...mentioning

confidence: 99%

“…Existence of regions that exhibit "anomalous" switching behavior have been reported previously [97,98] and was attributed either to charge injection/entrapment in the nonpolar phases [97] or to a local oppositely oriented electric field of the oxygen vacancies. [96] However, switching of the polarization against the applied field when it is ramped below a certain threshold value, would result in the narrow antihysteretic bias-on PFM loops (see Section S9 in the Supporting Information). In our measurements, absence of the antihysteretic behavior in L2 region in the bias-on PFM mode (Figure S9f in the Supporting Information) rules out the charge-related mechanisms as a probable cause for its anomalous switching.…”

Section: Coexistence Of Regions With Positive and Negative D 33eff In...mentioning

confidence: 99%

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Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy

Buragohain

Richter

et al. 2022

Advanced Materials

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Piezoresponse force microscopy (PFM) is widely used for characterization and exploration of the nanoscale properties of ferroelectrics. However, quantification of the PFM signal is challenging due to the convolution of various extrinsic and intrinsic contributions. Although quantification of the PFM amplitude signal has received considerable attention, quantification of the PFM phase signal has not been addressed. A properly calibrated PFM phase signal can provide valuable information on the sign of the local piezoelectric coefficient—an important and nontrivial issue for emerging ferroelectrics. In this work, two complementary methodologies to calibrate the PFM phase signal are discussed. The first approach is based on using a standard reference sample with well‐known independently measured piezoelectric coefficients, while the second approach exploits the electrostatic sample–cantilever interactions to determine the parasitic phase offset. Application of these methodologies to studies of the piezoelectric behavior in ferroelectric HfO2‐based thin‐film capacitors reveals intriguing variations in the sign of the longitudinal piezoelectric coefficient, d33,eff. It is shown that the piezoelectric properties of the HfO2‐based capacitors are inherently sensitive to their thickness, electrodes, as well as deposition methods, and can exhibit wide variations including a d33,eff sign change within a single device.

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Section: Thickness Effect On the D 33eff Sign In La:hfo 2 -Based Capa...mentioning

confidence: 99%

Section: Coexistence Of Regions With Positive and Negative D 33eff In...mentioning

confidence: 99%

Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy

Buragohain

Richter

et al. 2022

Advanced Materials

View full text Add to dashboard Cite

show abstract

Piezo- and pyroelectricity in Zirconia: a study with machine learned force fields

Cited by 1 publication

References 0 publications

Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy

Quantification of the Electromechanical Measurements by Piezoresponse Force Microscopy

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