2016
DOI: 10.1063/1.4953575
|View full text |Cite
|
Sign up to set email alerts
|

Piezoelectric response enhancement in the proximity of grain boundaries of relaxor-ferroelectric thin films

Abstract: The influence of surface morphology on the local piezoelectric response of highly (100)-textured 0.70PbMg2/3Nb1/3O3-0.30PbTiO3 thin films is studied using piezoresponse force microscopy in band-excitation mode. The local electromechanical response is mostly suppressed in direct proximity of the grain boundaries. However, within 100–200 nm of the grain boundary, the piezoresponse is substantially enhanced, before decaying again within a region at the center of the grain itself. Nested piezoresponse hysteresis c… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2017
2017
2021
2021

Publication Types

Select...
4

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 32 publications
0
2
0
Order By: Relevance
“…Understanding the overall macroscopic behavior of these heterogeneous materials as well as micro-and nanoscale applications necessitate assessment of local characteristics, which is widely studied using piezoresponse force microscopy (PFM) and related switching spectroscopy techniques. [9][10][11][12][13] PFM is based on detecting cantilever oscillation corresponding to periodic sample deformation in response to an alternating voltage (Vac) due to the converse piezoelectric effect. 14 However, Vac excitation also leads to detection of electrostatic forces between tip and sample, which can contribute to the measured signal in PFM.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Understanding the overall macroscopic behavior of these heterogeneous materials as well as micro-and nanoscale applications necessitate assessment of local characteristics, which is widely studied using piezoresponse force microscopy (PFM) and related switching spectroscopy techniques. [9][10][11][12][13] PFM is based on detecting cantilever oscillation corresponding to periodic sample deformation in response to an alternating voltage (Vac) due to the converse piezoelectric effect. 14 However, Vac excitation also leads to detection of electrostatic forces between tip and sample, which can contribute to the measured signal in PFM.…”
Section: Introductionmentioning
confidence: 99%
“…The remarkably high electrostrictive response observed in relaxor ferroelectrics combined with their large dielectric and electro-optic constants have awoken significant interest in these materials for applications such as electromechanical transducers, capacitive energy storage, and electro-optic modulators. Moreover, phase transitions between ferroelectric and relaxor states yield additional functionality in terms of pyroelectric energy harvesting or temperature-dependent electromechanical sensing, for which lead lanthanum zirconate titanate (PLZT) is a highly suitable material as it exhibits low phase transition temperatures near room temperature and large electrostriction. ,,,, Although the underlying physical phenomena warrant high scientific interest in itself, knowledge on the functional material response to an electric field at operating temperatures is also key to device design. Understanding the overall macroscopic behavior of these heterogeneous materials as well as micro- and nanoscale applications necessitates assessment of local characteristics, which is widely studied using the piezoresponse force microscopy (PFM) and related switching spectroscopy techniques. …”
Section: Introductionmentioning
confidence: 99%