Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

Abstract

Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed. AbstractPiezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.

Piezoelectricity and charge trapping in ZnO and Co-doped ZnO thin films

“…Originally used to detect domain structures, polarization switching, and for local hysteresis spectroscopy in ferroelectric materials, [25][26][27] PFM has recently been extended to characterize piezoelectric semiconductors, such as GaN, AlN, and ZnO. [28][29][30][31] Indeed, recently several PFM investigations on ZnO nanostructures and thin films have been carried out.…”

High-Resolution Studies of Domain Switching Behavior in Nanostructured Ferroelectric Polymers

“…[20][21][22][23][24] Over the span of just several years PFM has become a primary method to probe the static and dynamic properties of the ferroelectric materials at the nanoscale. 25 However, very few reports have succeeded in unambiguous high-resolution detection of polarization dynamics in PVDF-TrFE films as the PFM signal is strongly influenced by the presence of amorphous phase, complex morphology and can additionally be affected by morphological instability as a result of electrically induced decomposition of a polymer sample. 26 Improved crystallinity of the PVDF-TrFE samples used in this study and application of the resonance-enhanced PFM mode allowed us to delineate the polarization distribution and investigate the local switching behavior with the sub-10 nm spatial resolution that is rarely attainable in ferroelectric polymers.…”

Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains

“…54 The underpinning concept in piezoresponse force microscopy and ESM is the use of a SPM tip as a local strain sensor detecting bias-induced material deformation. [23][24][25][26]32,[55][56][57] In tip electrode PFM and ESM, the tip creates an electric field confined in a nanometersized region of material, inducing polarization switching or electrochemical processes. [58][59][60] In top-electrode PFM, the electric field is (approximately) uniform, while the strain detection is local.…”