Piperazine-based zirconium oxy-chloride (PzZrOCl) single crystal: a third-order nonlinear optical material for optoelectronic device applications

Abstract

Single crystals of Piperazine Zirconium Oxy-Chloride (PzZrOCl) are grown successfully by slow evaporation technique for Opto-electronic device applications. Suitability of the material is estimated and reported as follows. Crystal habits, purity, crystallite size, microstructure and bulk crystals structures are essential parameters for device compatibility hence they were examined with basic characterization techniques and studied to estimate their effects on optoelectronic properties. The outcomes from structural aspects are reasonably good. The functional groups of a molecule, their bond vibration frequencies and mode of alignments have been examined by Fourier Transform Infrared spectroscopy (FT-IR). The transmittance (98%) in the entire visible range with lowest cut-off wavelength (215 nm) and green emission (545 nm) is another evidence of suitability. The thermal and mechanical strength via hardness, Mayer index, yield strength and elastic stiffness constant is evaluated; it is thermally stable up to 162°C, mechanically strong and belongs to soft category. Laser induced damage is estimated by using Nd:YAG laser of wavelength 1064 nm and the observed values is three times higher than KDP, 1.2 times higher than LAPP. The optical nonlinear nature and its efficiency are examined by using Z-scan technique. The analysis discussed in detailed and the results strongly recommends PzZrOCl single crystals are suitable for optical and electronic device applications.