2019
DOI: 10.7567/1347-4065/ab0e4a
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PL properties and defects of SnS layers based on n-type buffer layers/p-type SnS structures

Abstract: The defect-related levels of n-type CdS/p-type SnS layers with thermal annealing were investigated through photoluminescence (PL) measurement. The SnS layer exhibited PL band at 1.13 eV. Based on the PL spectra observed at various excitation intensities and temperatures, PL peaks were attributed to donor to valence band transitions. Activation energy of donors in SnS was estimated to be 46 meV. The donor corresponding to the activation energy was due to interstitial Cadmium (Cd i ). Based on these data, a sche… Show more

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Cited by 7 publications
(10 citation statements)
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“…Alternatively, impurities in the p-type SnS layer from residual impurity gas in the deposition chamber may explain the low V OC . Moreover, the number of defects at the interface of SnS heterojunction thin-film solar cells can be reduced by a post-annealing process [71,72], which is very likely to also be effective to homojunction solar cells. Assuming that interface defects can be reduced by these means, solar cells with this structure are expected to exhibit a much higher V OC and conversion efficiency.…”
Section: Prototype Homojunction Solar Cells With N-type Sns Single Cr...mentioning
confidence: 99%
“…Alternatively, impurities in the p-type SnS layer from residual impurity gas in the deposition chamber may explain the low V OC . Moreover, the number of defects at the interface of SnS heterojunction thin-film solar cells can be reduced by a post-annealing process [71,72], which is very likely to also be effective to homojunction solar cells. Assuming that interface defects can be reduced by these means, solar cells with this structure are expected to exhibit a much higher V OC and conversion efficiency.…”
Section: Prototype Homojunction Solar Cells With N-type Sns Single Cr...mentioning
confidence: 99%
“…In general, polycrystalline thin films tend to be used for compound solar cells and exhibit numerous grain boundaries that may impede various measurement parameters. For SnS thin films, several film properties including grain boundary scattering and recombination centers have been observed experimentally through photoluminescence (PL), [7][8][9][10] temperature-dependent conductivity (σ) measurement, 11) temperature-dependent Hall measurements on σ, [12][13][14][15] and carrier concentration (n). [15][16][17] However, few experimental studies have detailed the defect properties and acceptor level of SnS epitaxial thin films, which have a small number of grain boundaries and highly oriented crystals.…”
Section: Introductionmentioning
confidence: 99%
“…The growth of a layered structure semiconductor such as MoS 2 on SiO 2 /Si substrates using sputtering has already been reported in a representative layered material, transition metal dichalcogenide. 32) The thin film properties 10,15,[33][34][35] and solar cell performance 35) of polycrystalline SnS films deposited using RF sputtering have already been reported; however, SnS epitaxial film grown using sputtering has not been clarified adequately. Sulfurization is also attractive as a post-deposition treatment to improve crystal quality, similar to annealing in general semiconductor materials.…”
Section: Introductionmentioning
confidence: 99%
“…Additionally, the constituent elements of SnS are earth-abundant, relatively inexpensive, and non-toxic, making it an environmentally friendly material. In our previous study, we analyzed the electrical, 7) crystal structural, 8) optical, 9) device structural, 10,11) and photovoltaic 12) properties of SnS thin films and SnS solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…[29][30][31][32][33][34] However, very few studies have been conducted on the p-n interface in an SnS film. 9) This knowledge is crucial for improving the device performance because carriers originate from the defects around the p-n interface. The acceptor/donor in an SnS film must be controlled using the extrinsic impurities owing to the density of an acceptor in the intrinsic defects of an SnS film being low.…”
Section: Introductionmentioning
confidence: 99%