Hetero-epitaxial growth of a gallium nitride (GaN) film on an AlN(0 0 0 1) buffer layer on a sapphire(0 0 0 1) substrate was demonstrated by supplying gallium precursors and nitrogen radicals separately from two individually operated plasma sources to control the V/III supplying ratio precisely. The sources were a reactive Ar-Cl 2 -mixture plasma sputtering of a gallium target and a remote low inductance antenna (LIA) for N 2 -H 2 inductively coupled-plasma. Lateral growth of the GaN film was observed in 0.5%-Cl 2 -added Ar sputtering at a low growth temperature of 670 °C, whilst the growth mode coalesced at temperatures lower than 600 °C. With more than 2.0% of Cl 2 , no film was deposited due to etching by the reactive chlorine whenever the temperature was at 500 °C. At the growth temperature of 670 °C, crystallinity with narrow a X-ray rocking curve GaN (0 0 0 2) was obtained at the condition of 0.5% Cl 2 and 27.4% N 2 , even though the background pressure was 10 −4 Pa.