2002
DOI: 10.1016/s0022-0248(01)02273-4
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Plasma characteristics of a multi-cusp plasma-sputter-type ion source for thin film formation of gallium nitride

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Cited by 4 publications
(5 citation statements)
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“…This decrease in the sputtered Ga was evident in the experiments of Flauta et al 5,6 The corresponding simulation result is shown in Fig. 4.…”
Section: Effect Of Sputteringsupporting
confidence: 52%
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“…This decrease in the sputtered Ga was evident in the experiments of Flauta et al 5,6 The corresponding simulation result is shown in Fig. 4.…”
Section: Effect Of Sputteringsupporting
confidence: 52%
“…Details of the experimental setup and procedure were described elsewhere. 5,6 Images of the target surface microstructure were obtained with a scanning electron microscope at different locations of the target in the chamber after ion source operation. Surface characterization studies revealed two distinct morphologies.…”
Section: Experimental Observationsmentioning
confidence: 99%
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“…The Ga target erosion by nitridation is issued on conventional sputtering processes. 20) Similarly, the stoichiometric control was of a great importance in the pulse sputtering deposition (PSD) method. 21) In terms of (iii), addition of chlorine gas in CCP source improves the crystallinity of the GaN film even at low temperature by the selective etching of the low crystalline phase.…”
Section: Introductionmentioning
confidence: 99%