2014
DOI: 10.1088/0022-3727/47/22/224001
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Plasma diagnostics for understanding the plasma–surface interaction in HiPIMS discharges: a review

Abstract: Mass spectrometry of atmospheric pressure plasmas S Große-Kreul, S Hübner, S. Schneider et al. Clusters in intense FLASH pulses C Bostedt, M Adolph, E Eremina et al. Dissociative attachment and vibrational excitation in electron collisions withCl2 M-W Ruf, S Barsotti, M Braun et al. Ionization dynamics of XUV excited clusters: the role of inelastic electron collisions M Müller, L Schroedter, T Oelze et al. Plasma diagnostics for understanding the plasma-surface interaction in HiPIMS discharges: a review Nikola… Show more

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Cited by 118 publications
(80 citation statements)
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“…The main reason is the rarefaction of the working gas due to momentum transfer between the sputtered atoms, and working gas atoms. This reasoning is substantiated by experimental evidences based on different plasma diagnostic techniques [32]. However, modeling also indicates there is an alternative mechanism for gas rarefaction, i.e.…”
Section: Peak Currentmentioning
confidence: 78%
“…The main reason is the rarefaction of the working gas due to momentum transfer between the sputtered atoms, and working gas atoms. This reasoning is substantiated by experimental evidences based on different plasma diagnostic techniques [32]. However, modeling also indicates there is an alternative mechanism for gas rarefaction, i.e.…”
Section: Peak Currentmentioning
confidence: 78%
“…Relationships among different EPPs discussed in [1] form a phenomenological basis for EPHT, PEO and other processes. A phenomenological model of coating stripping [78] can also be used to understand 12 various EPPs. Microdischarge evolution in the pores of oxide layers and oxide crystallisation phenomena during PEO processes have been discussed in [79][80][81].…”
Section: Model Classificationmentioning
confidence: 99%
“…It is not surprising to see smart elements, such as active plasma diagnostics and variable process parameters, in recent developments of plasma-based surface engineering technologies, e.g. PE-CVD [9,10] 5 and Hi-PIMS [11,12]; for EPPs however this still remains in a rudimentary state despite some recent progress [13].…”
mentioning
confidence: 99%
“…HiPIMS is typically characterised by high discharge peak currents and a high degree of ionisation of the sputtered species enabling energetic growth conditions with enhanced control possibilities during film deposition. The method has been reviewed several times and further details can be found in the following reviews: Helmersson et al [2], Sarakinos et al [3], Gudmundsson et al [4] and Britun et al [5].…”
Section: Introductionmentioning
confidence: 99%