2007
DOI: 10.1016/j.tsf.2006.10.131
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Plasma emission controlled multi-target reactive sputtering for in-situ crystallized Pb(Zr,Ti)O3 thin films on 6″ Si-wafers

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Cited by 20 publications
(10 citation statements)
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“…Moreover, the possibility of Ruddlesden-Popper phase formation in PbTiO 3 was predicted recently by first principle density function theory calculations [12]. In PZT thin films Pb 2 (Zr, Ti)O 4 was observed for the first time in [7]. The lattice constants derived from the XRD pattern were a≈0.39 nm, b≈0.375 nm, and c≈1.3 nm.…”
Section: Methodsmentioning
confidence: 76%
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“…Moreover, the possibility of Ruddlesden-Popper phase formation in PbTiO 3 was predicted recently by first principle density function theory calculations [12]. In PZT thin films Pb 2 (Zr, Ti)O 4 was observed for the first time in [7]. The lattice constants derived from the XRD pattern were a≈0.39 nm, b≈0.375 nm, and c≈1.3 nm.…”
Section: Methodsmentioning
confidence: 76%
“…ZrO 2 buffer layers are known to act as lead diffusion barrier [13,14]. Consequently, lead diffusion was confined to the PZT/ZrO 2 interface resulting in a leadenriched amorphous interface layer at 520°C as proofed by GD-OES composition profiling [7].…”
Section: Methodsmentioning
confidence: 89%
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“…The data were compared with bulk polycrystalline material as standard giving quantitative depth profile of the films. Similar method to rf-GD-AES was presented in the work of Vidyarthi et al, 2007, where chemical composition and depth profiling of PZT films was investigated by glow discharge optical emission spectroscopy (GDOES). They used two samples, which chemical composition was measured by RBS, to calibrate GDOES for PZT quantitative compositional analysis.…”
Section: Depth Profile Detection Methodsmentioning
confidence: 99%