2010
DOI: 10.1016/j.hedp.2009.07.001
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Plasma line broadening and computer simulations: A mini-review

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Cited by 48 publications
(38 citation statements)
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“…The profiles obtained considering specific experimental conditions allow researchers to undertake plasma diagnostics by direct comparison of the line profiles obtained in the simulations and those experimentally recorded. More details on CSM for line shapes calculations can be found in the review [83].…”
Section: I(ωe) Is the Broadened Profile Due To The Impact Electrons mentioning
confidence: 99%
“…The profiles obtained considering specific experimental conditions allow researchers to undertake plasma diagnostics by direct comparison of the line profiles obtained in the simulations and those experimentally recorded. More details on CSM for line shapes calculations can be found in the review [83].…”
Section: I(ωe) Is the Broadened Profile Due To The Impact Electrons mentioning
confidence: 99%
“…This exception becomes less important for the higher members of the Balmer series. Besides numerical simulations [7] an analytical unified description of the electrons and ions can be done with the model microfield method (MMM), derived by Brissaud and Frisch [8]. Here, time dependent electric micro fields produced by the plasma electrons and ions are introduced, where the field strength jumps instantaneously between constant values in a stochastic way [9,10].…”
Section: Theory Of Stark Broadening In a Plasmamentioning
confidence: 99%
“…The ion dynamics leads to an additional broadening, which can be important especially at low densities, high temperatures, or for lines with a low upper principal quantum number. Simulations involving a numerical integration of the Liouville Equation (3) and not referring to Equation (5) can also be performed, but they become time-consuming if the atomic system is complex [7,14,15].…”
Section: Stark Line Shape Modelingmentioning
confidence: 99%