Plasma-Polymerized Aniline–Diphenylamine Thin Film Semiconductors

Abstract

Semiconducting polymer thin films were grown by a DC plasma-polymerized technique using a mixture of aniline–diphenylamine as a precursor. FT-IR spectra were taken in order to analyze the structural properties of the resulting polymers. From morphological and structural studies performed by transmission electron microscope (TEM) and X-ray diffraction, an organized structure in plasma polymer thin films was distinguished. I–V characteristics in an asymmetric electrode configuration were studied to determine the conduction mechanism. It was found that the conduction mechanism controlled by SCLC is dominant in plasma-polymerized aniline–diphenylamine (PPAni-PDPA) thin films.