2014
DOI: 10.1134/s0030400x14090240
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Plasma screening of the fundamental absorption edge in crystals of Bi2Te3-Sb2Te3 solid solutions with more than 80 mol % Sb2Te3

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Cited by 7 publications
(6 citation statements)
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“…Other electronic causes, such as recently reported intraband transitions in the frequency range of our observations, cannot be ruled out completely. Only if the plasma frequency is slightly below this transition, it becomes discernible in the IR reflection spectra.…”
contrasting
confidence: 52%
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“…Other electronic causes, such as recently reported intraband transitions in the frequency range of our observations, cannot be ruled out completely. Only if the plasma frequency is slightly below this transition, it becomes discernible in the IR reflection spectra.…”
contrasting
confidence: 52%
“…Because the near-field optical microscope is extremely sensitive to small variations in the permittivity close to a resonance (ϵ ≈ −1...–3), indeed a localized modeonly occurring in certain areas of the samplecould potentially lead to a shifted response, even with a fixed charge carrier concentration. However, such a localized mode suggested in ref is not observed for pure Sb 2 Te 3 . Instead, it only appears in solid solutions of Sb 2 Te 3 with Bi 2 Te 3 or when doping with Sn.…”
mentioning
confidence: 76%
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“…The additional peak around ν = 1250 cm −1 could in principle be related to interband transitions observed for Sb 2 Te 3 in infrared reflectivity spectra between 1250 and 2000 cm −1 . 39 As these transitions were reported to show a broad peak in far-field spectra (several 100 cm −1 ), it appears unreasonable to link them to the sharp (several 10 cm −1 ) features observed in the near-field spectra. Very recently Schmidt et al observed using s-SNOM inter-subband transitions due to vertical confinement in few-layer WSe 2 .…”
Section: Acs Applied Nano Materialsmentioning
confidence: 98%