Abstract. In-situ X-ray diffraction was applied to isotactic polypropylene with a high volume fraction of !-phase (!-iPP) while it has been compressed at temperatures below and above its glass transition temperature T g . The diffraction patterns were evaluated by the Multi-reflection X-ray Profile Analysis (MXPA) method, revealing microstructural parameters such as the density of dislocations and the size of coherently scattering domains (CSD-size). A significant difference in the development of the dislocation density was found compared to compression at temperatures above T g , pointing at a different plastic deformation mechanism at these temperatures. Based on the individual evolutions of the dislocation density and CSD-size observed as a function of compressive strain, suggestions for the deformation mechanisms occurring below and above T g are made.