2000
DOI: 10.1364/ao.39.001164
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Pockels cell voltage probe for noninvasive electron-beam measurements

Abstract: Accurate measurements of beam position and current are critical for the operation of the high-energy electron accelerators used for radiographic applications. Traditional short-pulse (e.g., 70 ns) machines utilize B-dot loops to monitor these parameters with great success. For long-pulse (e.g., 2 micros) accelerators, beam position and current measurements become more challenging and may require new technology. A novel electro-optic voltage probe has been developed for this application and provides the advanta… Show more

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Cited by 8 publications
(6 citation statements)
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“…Because of their unique optoelectrical properties, ITO films have many applications, such as in solar cells, gas sensor, flat panel displays and in opto-electric devices such as Pockels cells [3]. Conventional ITO films can be prepared by various methods including reactive magnetron sputtering, electron beam evaporation, ion beam assist deposition, and pulsed laser deposition (PLD) [4].…”
Section: Introductionmentioning
confidence: 99%
“…Because of their unique optoelectrical properties, ITO films have many applications, such as in solar cells, gas sensor, flat panel displays and in opto-electric devices such as Pockels cells [3]. Conventional ITO films can be prepared by various methods including reactive magnetron sputtering, electron beam evaporation, ion beam assist deposition, and pulsed laser deposition (PLD) [4].…”
Section: Introductionmentioning
confidence: 99%
“…There is a paucity of papers on high field narrow pulse width electric field measurements using bulk EOS crystals 6 , 7 . Several experiments have been performed where bulk EOS crystals have been used for electron beam position monitoring in accelerators, but not explicit measurement of electric field components 8 – 11 . In Consoli 12 and Robinson et al 13 , the authors describe electro-optical measurements of electromagnetic pulses generated by laser-plasma interaction in the nanosecond regime where they measured a maximum external electric field 12 of 261 kV/m.…”
Section: Introductionmentioning
confidence: 99%
“…Using a wide variety of electro-optic crystals, electric fields have been optically measured in frequency regimes ranging from dc [1,2] to the microwave spectrum in both a CW [3] and a pulsed [4] configuration. Application environments studied include electron beams [5], radiation detectors [6], electrical discharges [7] and electrical power [8,9].…”
Section: Introductionmentioning
confidence: 99%