Point-Contact Spectroscopy of Heavy Fermion Compound CeRu₂Si₂ in Magnetic Field

Abstract

We have developed a new method to measure point-contact spectroscopy under pressure and in magnetic field, in which a thin-film deposition technique is used for making a point contact. In this work, we investigated a field dependence of the point-contact spectra of the heavy fermion compound CeRu 2 Si 2 single crystal, data is obtained in the form of differential resistivity dV /dI as a function of bias voltage V and the magnetic field applied along the a and c-axis. A zero bias peak on the dV /dI developed below 10 K in zero magnetic field. We consider that the peak structure is concerned with the Kondo effect. At high magnetic field of 13 T, the zero bias peak persisted although it was slightly suppressed.